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Fine Structure of Diffraction Losses in Single-Crystal X-Ray Lenses

  • DIFFRACTION AND SCATTERING OF IONIZING RADIATIONS
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Abstract

Single-crystal planar compound refractive lenses under diffraction losses (glitches) conditions, when a part of radiation incident on an optical element diffracts from some set of atomic planes, have been investigated. A detailed experimental study using synchrotron radiation of the influence of glitches on the focal spot formed by lenses has been performed. An analysis of the data obtained showed that diffraction losses arise on different parts of the parabolic lens profile due to the refraction effect at radiation energies differing by a few electronvolts. As a result, the shape of the focused beam changes with a change in energy near the energy of the glitch.

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ACKNOWLEDGMENTS

We are grateful to O. Yefanov (CFEL@DESY, Germany) for the help in planning the experiment, processing the data obtained, and participation in the preparation of this publication, as well as to I.A. Shchelokov for the help in the preparation of this publication.

Funding

This study was supported by the Ministry of Science and Higher Education of the Russian Federation (grant no. 075-15-2021-1362) and the Russian Foundation for Basic Research, project no 19-29-12043mk. N.B. Klimova acknowledges the partial support within the Russian Federal Academic Leadership Program Priority 2030 at the Immanuel Kant Baltic Federal University. V.A. Yunkin acknowledges the partial support within State assignment no. 075-00706-22-00. P.A. Prosekov acknowledges the partial support within the State assignment for the Federal Scientific Research Centre “Crystallography and Photonics” RAS. M. N. Sorokovikov acknowledges the partial support within the reported study was funded by Immanuel Kant Baltic Federal University, project number 121122900221-9.

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Authors and Affiliations

  1. Immanuel Kant Baltic Federal University, 236041, Kaliningrad, Russia

    N. B. Klimova, A. A. Barannikov, M. N. Sorokovikov, D. A. Zverev & A. A. Snigirev

  2. Institute of Microelectronics Technology and High Purity Materials, Russian Academy of Sciences, 142432, Chernogolovka, Moscow oblast, Russia

    V. A. Yunkin

  3. Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, 119333, Moscow, Russia

    P. A. Prosekov

  4. National Research Centre “Kurchatov Institute”, 123182, Moscow, Russia

    A. Yu. Seregin & A. E. Blagov

Authors
  1. N. B. Klimova
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  2. A. A. Barannikov
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  3. M. N. Sorokovikov
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  4. D. A. Zverev
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  5. V. A. Yunkin
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  6. P. A. Prosekov
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  7. A. Yu. Seregin
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  8. A. E. Blagov
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  9. A. A. Snigirev
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Corresponding author

Correspondence to N. B. Klimova.

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The authors declare that they have no conflicts of interest.

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Translated by Yu. Sin’kov

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Klimova, N.B., Barannikov, A.A., Sorokovikov, M.N. et al. Fine Structure of Diffraction Losses in Single-Crystal X-Ray Lenses. Crystallogr. Rep. 67, 838–844 (2022). https://doi.org/10.1134/S1063774522060128

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  • DOI: https://doi.org/10.1134/S1063774522060128

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