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Crystallography Reports

, Volume 64, Issue 1, pp 24–29 | Cite as

Experimental Study of Two-Beam X-Ray Diffractometry Using Synchrotron Radiation

  • V. G. Kohn
  • P. A. ProsekovEmail author
  • A. Yu. Seregin
  • A. G. KulikovEmail author
  • Yu. V. Pisarevsky
  • A. E. Blagov
  • M. V. Kovalchuk
DIFFRACTION AND SCATTERING OF IONIZING RADIATIONS

Abstract

A new scheme of two-beam X-ray diffractometry on the “X-Ray Crystallography and Physical Materials Science” (XCPM) beamline at the Kurchatov Synchrotron Radiation Source (KSRS) has been experimentally investigated. The scheme includes a standard double-crystal monochromator and a narrow slit installed in front of the sample. Measurements have been performed for the Si 111 and 311 reflections in the monochromator and the Si 111 and 220 reflections in the sample crystal. It is shown that this scheme allows one to obtain a near-proper diffraction reflection curve even in the case of symmetric diffraction if the Bragg angle for the monochromator exceeds the Bragg angle for the crystal sample by a factor of 2 or more. The experimental results coincide well with the theory.

Notes

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Copyright information

© Pleiades Publishing, Inc. 2019

Authors and Affiliations

  • V. G. Kohn
    • 1
    • 2
  • P. A. Prosekov
    • 1
    • 2
    Email author
  • A. Yu. Seregin
    • 1
    • 2
  • A. G. Kulikov
    • 1
    • 2
    Email author
  • Yu. V. Pisarevsky
    • 1
    • 2
  • A. E. Blagov
    • 1
    • 2
  • M. V. Kovalchuk
    • 1
    • 2
  1. 1.National Research Centre “Kurchatov Institute”MoscowRussia
  2. 2.Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics”, Russian Academy of SciencesMoscowRussia

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