Skip to main content
SpringerLink
Log in

The possibility of identifying the spatial location of single dislocations by topo-tomography on laboratory setups

  • Diffraction and Scattering of Ionizing Radiations
  • Published:
Crystallography Reports Aims and scope Submit manuscript

Abstract

The spatial arrangement of single linear defects in a Si single crystal (input surface {111}) has been investigated by X-ray topo-tomography using laboratory X-ray sources. The experimental technique and the procedure of reconstructing a 3D image of dislocation half-loops near the Si crystal surface are described. The sizes of observed linear defects with a spatial resolution of about 10 μm are estimated.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. I. L. Shul’pina and I. A. Prokhorov, Crystallogr. Rep. 57 (5), 661 (2012).

    Article  ADS  Google Scholar 

  2. W. Ludwig, P. Cloetens, J. Härtwig, et al., J. Appl. Crystallogr. 34, 602 (2001).

    Article  Google Scholar 

  3. D. Hanschke, L. Helfen, V. Altapova, et al., Appl. Phys. Lett. 101, 244103 (2012).

    Article  ADS  Google Scholar 

  4. A. C. Kak and M. Slaney, Principles of Computerized Tomographic Imaging (IEEE, New York, 1988).

    MATH  Google Scholar 

  5. D. A. Zolotov, A. V. Buzmakov, V. E. Asadchikov, et al., Crystallogr. Rep. 56 (3), 393 (2011).

    Article  ADS  Google Scholar 

  6. A. R. Lang, Acta Crystallogr. 2, 249 (1959).

    Article  Google Scholar 

  7. I. S. Besedin, F. N. Chukhovskii, and V. E. Asadchikov, Crystallogr. Rep. 59 (3), 323 (2014).

    Article  ADS  Google Scholar 

  8. E. V. Suvorov, I. A. Smirnova, and E. V. Shulakov, Poverkhnost, No. 4, 100 (2004).

    Google Scholar 

  9. A. H. Andersen and A. C. Kak, Ultrason. Imaging 6, 81 (1984).

    Article  Google Scholar 

  10. W. J. Palenstijn, K. J. Batenburg, and J. Sijbers, J. Struct. Biol. 176 (2), 250 (2011). http://dx.doi.org/. doi 10.1016/j.jsb.2011.07.017

    Article  Google Scholar 

  11. W. Van, W. J. Palenstijn J. De Beenhouwer., et al., Ultramicroscopy 157, 35 (2015). http://dx.doi.org/. doi 10.1016/j.ultramic.2015.05.002

    Article  Google Scholar 

  12. R. C. Gonzalez, R. E. Woods, and S. Eddins, Digital Image Processing Using MATLAB (Prentice-Hall, 2004).

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”, Russian Academy of Sciences, Moscow, 119333, Russia

    D. A. Zolotov, A. V. Buzmakov, D. A. Elfimov, V. E. Asadchikov & F. N. Chukhovskii

  2. Moscow State University, Moscow, 119991, Russia

    D. A. Elfimov & V. E. Asadchikov

Authors
  1. D. A. Zolotov
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. A. V. Buzmakov
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. D. A. Elfimov
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. V. E. Asadchikov
    View author publications

    You can also search for this author in PubMed Google Scholar

  5. F. N. Chukhovskii
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to D. A. Zolotov.

Additional information

Original Russian Text © D.A. Zolotov, A.V. Buzmakov, D.A. Elfimov, V.E. Asadchikov, F.N. Chukhovskii, 2017, published in Kristallografiya, 2017, Vol. 62, No. 1, pp. 12–16.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Zolotov, D.A., Buzmakov, A.V., Elfimov, D.A. et al. The possibility of identifying the spatial location of single dislocations by topo-tomography on laboratory setups. Crystallogr. Rep. 62, 20–24 (2017). https://doi.org/10.1134/S1063774517010266

Download citation

  • Received:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1134/S1063774517010266

Search

Navigation