X-ray diffraction and X-ray standing-wave study of the lead stearate film structure
A new approach to the study of the structural quality of crystals is proposed. It is based on the use of X-ray standing-wave method without measuring secondary processes and considers the multiwave interaction of diffraction reflections corresponding to different harmonics of the same crystallographic reflection. A theory of multiwave X-ray diffraction is developed to calculate the rocking curves in the X-ray diffraction scheme under consideration for a long-period quasi-one-dimensional crystal. This phase-sensitive method is used to study the structure of a multilayer lead stearate film on a silicon substrate. Some specific structural features are revealed for the surface layer of the thin film, which are most likely due to the tilt of the upper layer molecules with respect to the external normal to the film surface.
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- 3.V. G. Kohn and L. V. Samoilova, Phys. Status Solidi A 133 (1) (1992).Google Scholar
- 4.A. Yu. Kazimirov, M. V. Koval’chuk, and V. G. Kohn, Kristallografiya 39 (2), 258 (1994).Google Scholar
- 5.M. A. Marchenkova, Yu. A. D’yakova, A. Yu. Seregin, et al., Poverkhnost, No. 11, 1 (2013).Google Scholar
- 6.V. Holy, U. Pietsch, and T. Baumbach, High-Resolution X-Ray Scattering from Thin Films and Multilayers. Springer Tracts in Modern Physics (Springer, Berlin, 1999), Vol. 149, Pt. I, p. 31.Google Scholar
- 9.A. M. Afanas’ev and V. G. Kohn, Zh. Eksp. Teor. Fiz. 74 (1), 300 (1978).Google Scholar
- 14.Z. G. Pinsker, X-ray Crystal Optics (Nauka, Moscow, 1982) [in Russian].Google Scholar
- 16.V. V. Klechkovskaya and L. A. Feigin, Kristallografiya 43 (6), 975 (1998).Google Scholar