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Electron microscopy of iron chalcogenide FeTe(Se) films

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Abstract

The structure of Fe1 + δTe1 − x Se x films (x = 0; 0.05) grown on single-crystal MgO and LaAlO3 substrates has been investigated by transmission and scanning transmission electron microscopy. The study of Fe1.11Te/MgO structures has revealed two crystallographic orientation relationships between the film and substrate. It is shown that the lattice mismatch between the film and substrate is compensated for by the formation of misfit dislocations. The Burgers vector projection is determined. The stresses in the film can partially be compensated for due to the formation of an intermediate disordered layer. It is shown that a FeTe0.5Se0.5 film grown on a LaAlO3 substrate is single-crystal and that the FeTe0.5Se0.5/LaAlO3 interface in a selected region is coherent. The orientation relationships between the film and substrate are also determined for this case.

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Authors and Affiliations

  1. National Research Centre “Kurchatov Institute”, pl. Akademika Kurchatova 1, Moscow, 123182, Russia

    I. O. Shchichko, M. Yu. Presnyakov & A. L. Vasil’ev

  2. Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii pr. 59, Moscow, 119333, Russia

    E. A. Stepantsov, I. P. Makarova & A. L. Vasil’ev

  3. Moscow State University, Moscow, 119992, Russia

    I. O. Shchichko, S. M. Kazakov & E. V. Antipov

Authors
  1. I. O. Shchichko
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  2. M. Yu. Presnyakov
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  3. E. A. Stepantsov
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  4. S. M. Kazakov
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  5. E. V. Antipov
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  6. I. P. Makarova
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  7. A. L. Vasil’ev
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Corresponding author

Correspondence to A. L. Vasil’ev.

Additional information

Original Russian Text © I.O. Shchichko, M.Yu. Presnyakov, E.A. Stepantsov, S.M. Kazakov, E.V. Antipov, I.P. Makarova, A.L. Vasil’ev, 2015, published in Kristallografiya, 2015, Vol. 60, No. 3, pp. 416–422.

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Shchichko, I.O., Presnyakov, M.Y., Stepantsov, E.A. et al. Electron microscopy of iron chalcogenide FeTe(Se) films. Crystallogr. Rep. 60, 370–376 (2015). https://doi.org/10.1134/S1063774515030165

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  • DOI: https://doi.org/10.1134/S1063774515030165

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