Abstract
A kinematical approximation has been derived from the general formulas for calculating the reflectivity from a multilayer anisotropic structure. An explicit form of reflection matrices at the boundary of layers and the refraction tensors has been obtained for a particular case where the layer magnetization is oriented in the surface plane and for an arbitrary form of X-ray susceptibility tensors. Calculations of the reflectivity from a Nb(4 nm)/[Dy(5 nm)/Lu(3 nm)]420 model structure with helicoidal ordering of Dy magnetic layers show that kinematical approximation can be applied for grazing angles that are larger than the critical total-reflection angle and that the “magnetic” refraction must be taken into account.
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Andreeva, M.A., Repchenko, Y.L. Kinematical limit in the theory of X-ray magnetic reflectivity. Crystallogr. Rep. 58, 1037–1042 (2013). https://doi.org/10.1134/S106377451307002X
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DOI: https://doi.org/10.1134/S106377451307002X