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Characteristics of structure formation in zinc and cadmium chalcogenide films deposited on nonorienting substrates

  • Surface and Thin Films
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Abstract

The phase composition, texture quality, size of coherent scattering domains, microstrain level, and concentration of stacking faults in zinc and cadmium chalcogenide (ZnS, ZnSe, ZnTe, CdSe, CdTe) films deposited by close-spaced vacuum sublimation method on nonorienting substrates have been investigated. The analysis was performed by X-ray diffraction. The substructural characteristics were determined from the physical broadening of diffraction lines using the Hall method and threefold convolution. The dependence of the structural properties of chalcogenide films on the deposition conditions are characterized.

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Authors and Affiliations

  1. Sumy State University, Rimsky-Korsakov str. 2, UA-40007, Sumy, Ukraine

    A. S. Opanasyuk, D. I. Kurbatov, V. V. Kosyak & S. I. Kshniakina

  2. Applied Physics Institute, National Academy of Sciences of Ukraine, Petropavlovskaya str.58, UA-40030, Sumy, Ukraine

    S. N. Danilchenko

Authors
  1. A. S. Opanasyuk
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  2. D. I. Kurbatov
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  3. V. V. Kosyak
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  4. S. I. Kshniakina
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  5. S. N. Danilchenko
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Correspondence to A. S. Opanasyuk.

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Opanasyuk, A.S., Kurbatov, D.I., Kosyak, V.V. et al. Characteristics of structure formation in zinc and cadmium chalcogenide films deposited on nonorienting substrates. Crystallogr. Rep. 57, 927–933 (2012). https://doi.org/10.1134/S1063774512070206

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  • DOI: https://doi.org/10.1134/S1063774512070206

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