Abstract
The phase composition, texture quality, size of coherent scattering domains, microstrain level, and concentration of stacking faults in zinc and cadmium chalcogenide (ZnS, ZnSe, ZnTe, CdSe, CdTe) films deposited by close-spaced vacuum sublimation method on nonorienting substrates have been investigated. The analysis was performed by X-ray diffraction. The substructural characteristics were determined from the physical broadening of diffraction lines using the Hall method and threefold convolution. The dependence of the structural properties of chalcogenide films on the deposition conditions are characterized.
Similar content being viewed by others
References
A. N. Georgobiani, Usp. Fiz. Nauk 113(1), 129 (1974).
Y. Hamakawa, Thin-Film Solar Cells: Next Generation Photovoltaic and Its Applications (Springer, Berlin, 2004).
K. Takahashi, A. Yoshikawa, and A. Sandhu, Wide Bandgap Semiconductors. Fundamental Properties and Modern Photonic and Electronic Devices (Springer, New York, 2007).
S. Kasap and P. Capper, The Springer Handbook of Electronic and Photonic Materials (Springer, Berlin, 2007).
A. Farenbruk, Solar Elements: Theory and Experiment (Energoatomizdat, Moscow, 1987) [in Russian].
P. A. Panchekha, O. G. Alaverdova, and V. I. Gnidash, Ukr. Fiz. Zh. 45(1), 75 (2000).
P. A. Panchekha, Funct. Mater. 7(2), 1 (2000).
I. P. Kalinkin and V. B. Aleskovskii, Epitaxial Films of A2B6 Compounds (Izd-vo LGU, Leningrad, 1978) [in Russian].
Yu. Z. Bubnov, M. S. Lur’e, and F. G. Staroe, Vacuum Deposition of Films in Quasi-Closed Volume (Sov. radio, Moscow, 1975) [in Russian].
A. Lopez-Otero, Thin Solid Films 49, 3 (1978).
V. V. Kosyak, A. S. Opanasyuk, P. M. Bukivskij, et al., J. Cryst. Growth 312, 1726 (2010).
Selected Powder Diffraction Data for Education and Training: Search Manual and Data Cards (Int. Centre for Diffraction, USA, 1988).
Ya. S. Umanskii, Yu. A. Skakov, A. N. Ivanov, and L. N. Rastorguev, Crystallography, X-Ray diffraction, and Electron Microscopy (Metallurgiya, Moscow, 1982) [in Russian].
D. K. Bowen and K. Brian-Tenner, X-Ray Metrology in Semiconductor Manufacturing (Taylor & Francis, Oxford, 2006).
Ch. S. Barret and T. B. Masal’skii, Structure of Metals (Metallurgiya, Moscow, 1984) [in Russian].
A. S. Kagan, L. M. Shishlyannikova, and A. P. Unikel’, Zavod. Lab. 46(10), 903 (1980).
D. Kurbatov, A. Opanasyuk, and H. Khlyap, Phys. Status Solidi A 206, 1549 (2009).
V. K. Komar’ and V. M. Puzikov, Single Crystals of the A 2 B 6 Group: Growth, Properties, and Application (Inst. for Single Crystals, Khar’kov, 2002) [in Russian].
L. S. Palatnik, M. Ya. Fuks, and V. M. Kosevich, Mechanism of Formation and Substructure of Condensed Films (Nauka, Moscow, 1972) [in Russian].
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Opanasyuk, A.S., Kurbatov, D.I., Kosyak, V.V. et al. Characteristics of structure formation in zinc and cadmium chalcogenide films deposited on nonorienting substrates. Crystallogr. Rep. 57, 927–933 (2012). https://doi.org/10.1134/S1063774512070206
Received:
Published:
Issue Date:
DOI: https://doi.org/10.1134/S1063774512070206