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Precision structural diagnostics of layered superconductor/ferromagnet nanosystems V/Fe by reflectometry and diffuse scattering of synchrotron radiation

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Abstract

Layered superconducting ferromagnetic nanosystems Cu(32 nm)/V(40–80 nm)/Fe(0.5–4 nm)/MgO(001) have been investigated by reflectometry and the diffuse scattering of synchrotron radiation. The data obtained make it possible to determine the important characteristics of samples such as the layer thickness and the rms heights and lateral correlation lengths of roughness at the interfaces.

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Authors and Affiliations

  1. Moscow State University, Moscow, Russia

    A. M. Nikitin, Yu. N. Khaydukov & V. L. Aksenov

  2. National Research Center Kurchatov Institute, Moscow, Russia

    A. M. Nikitin, M. M. Borisov, E. Kh. Mukhamedzhanov & M. V. Kovalchuk

  3. Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii pr. 59, Moscow, 119333, Russia

    M. V. Kovalchuk

  4. KFKI Research Institute for Particle and Nuclear Physics, Hungarian Academy of Sciences, Budapest, Hungary

    S. Sajti, F. Tancziko, L. Deak & L. Bottyan

Authors
  1. A. M. Nikitin
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  2. M. M. Borisov
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  3. E. Kh. Mukhamedzhanov
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  4. M. V. Kovalchuk
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  5. S. Sajti
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  6. F. Tancziko
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  7. L. Deak
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  8. L. Bottyan
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  9. Yu. N. Khaydukov
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  10. V. L. Aksenov
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Correspondence to A. M. Nikitin.

Additional information

Original Russian Text © A.M. Nikitin, M.M. Borisov, E.Kh. Mukhamedzhanov, M.V. Kovalchuk, S. Sajti, F. Tancziko, L. Deak, L. Bottyan, Yu.N. Khaydukov, V.L. Aksenov, 2011, published in Kristallografiya, 2011, Vol. 56, No. 5, pp. 917–924.

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Nikitin, A.M., Borisov, M.M., Mukhamedzhanov, E.K. et al. Precision structural diagnostics of layered superconductor/ferromagnet nanosystems V/Fe by reflectometry and diffuse scattering of synchrotron radiation. Crystallogr. Rep. 56, 858–865 (2011). https://doi.org/10.1134/S106377451105021X

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  • DOI: https://doi.org/10.1134/S106377451105021X

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