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Investigation of the formation of quasicrystalline Al70-Pd20-Re10 phase in situ during annealing

  • Surface and Thin Films
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Abstract

The change in the phase composition of thin-film layered AlPdRe nanostructures during annealing, which led to the formation of a quasicrystalline layer, has been studied in situ. It is shown that the Al3Pd phase is formed at a temperature above 260°C, which transforms into the AlPd phase at 580°C, and the icosahedral quasicrystalline Al-Pd-Re phase is formed at 680°C.

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Authors and Affiliations

  1. Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii pr. 59, Moscow, 119333, Russia

    I. A. Makhotkin, S. N. Yakunin, A. Yu. Seregin & E. Yu. Tereshchenko

  2. Russian Research Center Kurchatov Institute, pl. Akademika Kurchatova 1, Moscow, 123182, Russia

    S. N. Yakunin, A. Yu. Seregin, D. S. Shaitura & M. B. Tsetlin

  3. FOM Institute for Plasma Physics Rijnhuizen, Nieuwegein, The Netherlands

    I. A. Makhotkin

Authors
  1. I. A. Makhotkin
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  2. S. N. Yakunin
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  3. A. Yu. Seregin
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  4. D. S. Shaitura
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  5. M. B. Tsetlin
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  6. E. Yu. Tereshchenko
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Corresponding author

Correspondence to A. Yu. Seregin.

Additional information

Original Russian Text © I.A. Makhotkin, S.N. Yakunin, A.Yu. Seregin, D.S. Shaitura, M.B. Tsetlin, E.Yu. Tereshchenko, 2011, published in Kristallografiya, 2011, Vol. 56, No. 5, pp. 930–933.

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Makhotkin, I.A., Yakunin, S.N., Seregin, A.Y. et al. Investigation of the formation of quasicrystalline Al70-Pd20-Re10 phase in situ during annealing. Crystallogr. Rep. 56, 871–874 (2011). https://doi.org/10.1134/S106377451105018X

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  • DOI: https://doi.org/10.1134/S106377451105018X

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