Abstract
An accurate X-ray diffraction study of Sr3TaGa3Si2O14 (STGS) crystal (a = 8.3023(10) Å, c = 5.0853(2) Å, sp. gr. P321, Z = 1, R/wR = 0.59/0.52%, 4004 independent reflections) is performed. The use of two independent data sets obtained on diffractometers with point and 2D detectors made it possible to determine the model structure characterized by the best reproducibility of parameters. The ordered distribution of atoms over crystallographic positions and the anharmonic character of displacements of all cations and one oxygen atom are established.
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Original Russian Text © A.P. Dudka, B.V. Mill, 2011, published in Kristallografiya, 2011, Vol. 56, No. 3, pp. 478–485.
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Dudka, A.P., Mill, B.V. Crystal structure refinement of Sr3TaGa3Si2O14 . Crystallogr. Rep. 56, 443–450 (2011). https://doi.org/10.1134/S1063774511020064
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DOI: https://doi.org/10.1134/S1063774511020064