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New method for calculating the intensities of X rays and thermal neutrons diffracted in single crystals with defects

  • Diffraction and Scattering of Ionizing Radiations
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Abstract

A new method is proposed to calculate the intensities of X rays and thermal neutrons diffracted in single crystals with defects. This method is based on comparing the dynamic theory of the Bragg diffraction of X rays and thermal neutrons in perfect single crystals with the small-angle scattering theory.

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References

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Authors and Affiliations

  1. Institute of Applied Problems of Physics, National Academy of Sciences of the Republic of Armenia, Yerevan, Russia

    A. M. Egiazaryan, K. M. Gevorkyan & A. K. Atanesyan

Authors
  1. A. M. Egiazaryan
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  2. K. M. Gevorkyan
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  3. A. K. Atanesyan
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Corresponding author

Correspondence to K. M. Gevorkyan.

Additional information

Original Russian Text © A.M. Egiazaryan, K.M. Gevorkyan, A.K. Atanesyan, 2011, published in Kristallografiya, 2011, Vol. 56, No. 3, pp. 439–440.

Reported at the International Conference “Electron, Positron, Neutron, and X-Ray Scattering under External Effects, Yerevan-Megri, 2009.

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Egiazaryan, A.M., Gevorkyan, K.M. & Atanesyan, A.K. New method for calculating the intensities of X rays and thermal neutrons diffracted in single crystals with defects. Crystallogr. Rep. 56, 405–406 (2011). https://doi.org/10.1134/S1063774510051013

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  • DOI: https://doi.org/10.1134/S1063774510051013

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