Skip to main content
SpringerLink
Log in

New aspect of diffraction of a highly divergent characteristic X-ray beam

  • Diffraction and Scattering of Ionizing Radiations
  • Published:
Crystallography Reports Aims and scope Submit manuscript

Abstract

A new way of implementing the diffraction of a highly divergent characteristic X-ray beam has been developed. This method is based on the formation of a diffraction image by the X rays exiting particular (active) points on the crystal surface which lie on hyperbolas. There is a correspondence between the points on the crystal surface and the points in the diffraction image. Local distortions of the crystal structure lead to local deviations of the diffraction lines from proper hyperbolas. This method makes it possible to reveal the block structure of crystals, separate blocks, and estimate the degree of misorientation.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. V. V. Aristov, V. Sh. Shekhtman, and I. M. Shmyt’ko, Kristallografiya 21, 50 (1976) [Sov. Phys. Crystallogr. 21, 25 (1976)].

    Google Scholar 

  2. V. V. Aristov, I. M. Shmyt’ko, and E. V. Shulakov, Kristallografiya 21, 351 (1976) [Sov. Phys. Crystallogr. 21, 191 (1976)].

    Google Scholar 

  3. V. V. Aristov, V. F. Kuleshov, V. Sh. Shekhtman, et al., Poverkhnost: Fiz., Khim., Mekh. 4, 134 (1985).

    Google Scholar 

  4. J. Bauch, J. Brechbuhl, H.-J. Ullrich, et al., Cryst. Res. Technol. 34, 71 (1999).

    Article  Google Scholar 

  5. J. Brechbuhl, J. Bauch, and H.-J. Ullrich, Cryst. Res. Technol. 34, 59 (1999).

    Article  Google Scholar 

  6. J. Bauch, H.-J. Ullrich, and D. Reiche, Cryst. Res. Technol. 35, 473 (2000).

    Article  Google Scholar 

  7. J. Bauch, H.-J. Ullrich, M. Bohling, and D. Reiche, Cryst. Res. Technol. 38, 440 (2003).

    Article  Google Scholar 

  8. J. Bauch, St. Wege, M. Bohling, and H.-J. Ullrich, Cryst. Res. Technol. 39, 623 (2004).

    Article  Google Scholar 

  9. M. Bohling and J. Bauch, Cryst. Res. Technol. 42, 905 (2007).

    Article  Google Scholar 

  10. V. N. Tkach, Semicond. Phys. Quantum Electron. Optoelectron. 5, 36 (2002).

    Google Scholar 

  11. D. R. Lee, Y. S. Chu, Y. Choi, et al., Appl. Phys. Lett. 82, 982 (2003).

    Article  ADS  Google Scholar 

  12. K. T. Avetyan, M. M. Arakelyan, P. A. Grigoryan, et al., Izv. Akad. Nauk Arm. 41(6), 426 (2006).

    Google Scholar 

  13. K. T. Avetyan and M. M. Arakelyan, Kristallografiya 53(5), 816 (2008).

    Google Scholar 

  14. K. T. Avetyan, L. V. Levonyan, et al., Kristallografiya 54(3), 418 (2009) [Crystallogr. Rep. 54 (3), 386 (2009)].

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Yerevan State University, Yerevan, 0025, Armenia

    K. T. Avetyan

Authors
  1. K. T. Avetyan
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to K. T. Avetyan.

Additional information

Original Russian Text © K.T. Avetyan, 2010, published in Kristallografiya, 2010, Vol. 55, No. 5, pp. 787–792.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Avetyan, K.T. New aspect of diffraction of a highly divergent characteristic X-ray beam. Crystallogr. Rep. 55, 737–742 (2010). https://doi.org/10.1134/S1063774510050032

Download citation

  • Received:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1134/S1063774510050032

Keywords

Search

Navigation