Abstract
Different mechanisms of formation of purely resonant reflections hhl (h = 2n + 1) during resonant diffraction of X-ray synchrotron radiation in zinc oxide, whose intensity very strongly changes with an increase in temperature, are considered. Such reflections, forbidden in the dipole-dipole scattering, can be excited owing to the dipole-quadrupole scattering and the anisotropy of X-ray susceptibility induced by thermal motion of atoms and point defects. Different contributions are theoretically considered and it is shown that they can be separated owing to their different temperature dependences.
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Original Russian Text © A.M. Kolchinskaya, V.E. Dmitrienko, S. Collins, E.N. Ovchinnikova, A.P. Oreshko, 2007, published in Kristallografiya, 2007, Vol. 52, No. 4, pp. 631–637.
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Kolchinskaya, A.M., Dmitrienko, V.E., Collins, S. et al. Formation conditions and temperature dependence of forbidden reflections during resonant X-ray diffraction in zinc oxide single crystals. Crystallogr. Rep. 52, 604–610 (2007). https://doi.org/10.1134/S1063774507040062
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DOI: https://doi.org/10.1134/S1063774507040062