Abstract
A set of measured thermal shifts {Δϑi} of diffraction peaks is numerically processed by introducing special variables z i , y i , and x i , and linear relations are obtained between the thermal shifts characterized by the values of z i as functions of the variables x i and y i , which depend on the crystal-plane indices and the unit-cell parameters of the crystal. After the least-squares fit, these relations can be represented in a graphical form. The thermal expansion coefficients are determined directly from these plots or analytically.
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Original Russian Text © S.G. Samoĭlov, A.I. Orlova, G.N. Kazantsev, A.V. Bankrashkov, 2006, published in Kristallografiya, 2006, Vol. 51, No. 3, pp. 519–522.
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Samovĭlov, S.G., Orlova, A.I., Kazantsev, G.N. et al. A technique for determining thermal expansion coefficients in cubic, tetragonal, hexagonal, and orthorhombic crystals. Crystallogr. Rep. 51, 486–489 (2006). https://doi.org/10.1134/S1063774506030187
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DOI: https://doi.org/10.1134/S1063774506030187