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Prototype Data Concentrator ASIC for Time-Projection Chamber of MPD Experiment

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Abstract

The results of the prototype development of a data concentrator application-specific integrated circuit (ASIC) for the time-projection chamber of the MPD experiment (NICA, Dubna) are presented. ASIC is designed to serialize data coming from two SAMPA detector chips and transmit them via AWG 36 type electrical cables of up to 1 m length at 2.56 Gbit/s transmission rate to the data acquisition controller board. The article describes the structure, main characteristics and layout of the ASIC, as well as the protocol of data exchange with the external controller. A description is given of the design methods used to ensure the radiation tolerance of ASIC to the effects of high-energy particles. The prototypes are manufactured using 65 nm CMOS process from TSMC and embedded in CPGA120 package. The total power consumption of the ASIC does not exceed 500 mW.

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REFERENCES

  1. Vereschagin, S., Movchan, S., and Zaporozhets, S., Front-end electronics development for TPC/MPD detector of NICA project, J. Instrum., 2020, vol. 15, p. c09044; Lee, H.T. et al., J. Nucl. Mater., 2011, vol. 415, pp. S696–S700.

    Article  Google Scholar 

  2. Averyanov, A., Bazhazhin, A., Chepurnov, V.F., Chepurnov, V.V., et al., Time projection chamber for multi-purpose detector at NICA, Technical Design Report, Rev.07, Dubna: JINR, Labor. High Energy Phys., 2018. http://mpd.jinr.ru/wp-content/uploads/2019/01/TpcTdr-v07.pdf.

    Google Scholar 

  3. Adolfsson, J. et al., (ALICE Collab.), SAMPA chip: the new 32 channels ASIC for the ALICE TPC and MCH upgrades, J. Instrum., 2017, vol. 12, p. C04008.

    Article  Google Scholar 

  4. Velure, A. and Sanches, B., SAMPA V3 Specifications rev. 0.1, 2017. https://indico.cern.ch/event/617831/attachments/1428015/2199874/SAMPA_V3_Specification.pdf.

  5. Bonacini, P., Valerio, R., Avramidou, R., Ballabriga, R., Faccio, F., Kloukinas, K., and Marchioro, A., Characterization of a commercial 65 nm CMOS technology for SLHC applications, J. Instrum., 2012, vol. 7, p. 01015.

    Article  Google Scholar 

  6. Kulis, S., Jara Casas, L., Ceresa, D., Miryala, S., Christianses, J., Francisco, R., and Gnani, D., Characterization of radiation effects in 65 nm digital circuits with the DRAD digital radiation test chip, J. Instrum., 2017, vol. 12, pp. C02039–C02039.

    Article  Google Scholar 

  7. Semenova, I., Simulation of dose and fluence quantities inside/outside MPD using FLUKA Monte Carlo code, in Proceedings of the MPD Technical Board Meeting, November 12, 2019.

  8. Lacoe, R., Improving integrated circuit performance through the application of hardness-by-design methodology, IEEE Trans. Nucl. Sci., 2008, vol. 55, pp. 1903–1925.

    Article  Google Scholar 

  9. Fleetwood, D., Total ionizing dose effects in MOS and low-dose-rate-sensitive linear-bipolar devices, IEEE Trans. Nucl. Sci., 2013, vol. 60, pp. 1706–1730.

    Article  Google Scholar 

  10. Atkin, E.V., Serazetdinov, A.R., and Khokhlov, K.O., Parametric layout cell design of N-MOS transistor with enhanced radiation hardened properties, AIP Conf. Proc., 2020, vol. 2313, p. 040009.

    Google Scholar 

  11. Caratelli, A., Scarfi, S., Bergamin, G., Ceresa, D., de Clerq, J., Kloukinas, K., and Leblebici, Y., Low-power SEE hardening techniques and error rate evaluation in 65 nm readout ASICs, PoS TWEPP2019, 2020, p. 015.

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Funding

The study was supported by the Russian Foundation for Basic Research, project no. 18-02-40093.

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Correspondence to E. V. Atkin or D. D. Normanov.

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The authors declare that they have no conflicts of interest.

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Azarov, D.A., Atkin, E.V., Ivanov, P.Y. et al. Prototype Data Concentrator ASIC for Time-Projection Chamber of MPD Experiment. Russ Microelectron 51, 111–116 (2022). https://doi.org/10.1134/S1063739722020032

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  • DOI: https://doi.org/10.1134/S1063739722020032

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