Abstract—
The pace of development of the microelectronic industry and the progress in the development of computer-aided design tools make problems associated with the development of combinational circuits that are resistant to short self-clearing faults relevant again. These faults occur due to a combination of many different factors, such as extreme operating conditions and transition to nanometer design standards. Structural redundancy methods are often used to solve this problem by the principles of the noiseless coding theory to protect information during its transmission over communication channels. However, these methods have a significant drawback, i.e., large structural redundancy. In this paper, we propose to use an approach based on the synthesis of fault-tolerant combinational circuits based on the spectral R-code to solve the problem of developing fault tolerant combinational circuits. If a specific part of the coder is protected using special technological means, this code can correct a single-bit error and detect a double-bit error. The resulting circuit has less structural redundancy compared to the traditional method of triple modular redundancy (TMR). An approach is also proposed based on partitioning circuit outputs into groups followed by synthesizing fault-tolerant combinational circuits based on the R-code, which increases the probability of error detection/correction, to minimize the probability of multiple-bit errors within a combinational circuit. The paper presents the results of a series of numerical experiments that show the efficiency of the proposed approaches.
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Stempkovskii, A.L., Tel’pukhov, D.V., Zhukova, T.D. et al. Synthesis of a Concurrent Error Detection Circuit Based on the Spectral R-Code with the Partitioning of Outputs into Groups. Russ Microelectron 48, 240–249 (2019). https://doi.org/10.1134/S1063739719040097
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DOI: https://doi.org/10.1134/S1063739719040097