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Interaction of electromagnetic H-wave with thin metal film

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Abstract

It is shown that for thin metal films whose thickness does not exceed that of the skin layer the problem can be solved analytically for arbitrary boundary conditions. The transmission, reflection, and absorption coefficients are analyzed as functions of the angle of incidence of the electromagnetic wave, thickness of the layer, specular reflectivity, and field oscillation frequency.

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Authors and Affiliations

  1. Moscow State Regional University, Moscow, 105005, Russia

    A. V. Latyshev & A. A. Yushkanov

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  1. A. V. Latyshev
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  2. A. A. Yushkanov
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Correspondence to A. V. Latyshev.

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Original Russian Text © A.V. Latyshev, A.A. Yushkanov, 2012, published in Mikroelektronika, 2012, Vol. 41, No. 1, pp. 30–35.

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Latyshev, A.V., Yushkanov, A.A. Interaction of electromagnetic H-wave with thin metal film. Russ Microelectron 41, 25–30 (2012). https://doi.org/10.1134/S1063739712010076

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