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Dependence of the transversal magneto-optic Kerr effect on the incidence angle of light for ultrathin films of cobalt and Co/Cu/Co multilayers

Abstract

The transversal magneto-optic Kerr effect in thin cobalt films and Co/Cu/Co structures obtained by magnetron sputtering in the magnetic field is investigated. It is shown that the dependences of the TMOKE and reflection intensity on the incidence angle of light substantially vary upon varying the thickness of the cobalt layer from 6 to 0.7 nm. The theoretical evaluation of the obtained data in the context of the classic theory of propagation of light in the conducting medium is presented

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Correspondence to M. V. Lokhankin.

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Original Russian Text © V.V. Naumov, V.A. Paporkov, M.V. Lokhankin, 2009, published in Mikroelektronika, 2009, Vol. 38, No. 4, pp. 273–279.

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Naumov, V.V., Paporkov, V.A. & Lokhankin, M.V. Dependence of the transversal magneto-optic Kerr effect on the incidence angle of light for ultrathin films of cobalt and Co/Cu/Co multilayers. Russ Microelectron 38, 251–256 (2009). https://doi.org/10.1134/S1063739709040039

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PACS

  • 68.37.-d