Advertisement

Journal of Analytical Chemistry

, Volume 72, Issue 13, pp 1350–1353 | Cite as

A New Approach to Increasing the Resolution of a Mass Spectrometer with Wedge-Shaped Reflectors

  • E. A. Sysoeva
  • A. V. Spakhov
  • Alexander A. SysoevEmail author
Articles
  • 19 Downloads

Abstract

The paper describes the investigation of the ion-optical properties of a laser TOF mass spectrometer including two successively positioned wedge-shaped ion mirrors. Some specific properties of the configuration of ion trajectories near their reflection in the second ion reflector are found. The dependence of aberrations on ion energy acquired toothed shape for the resolution of the analyzer higher than 3000–5000. The approximation of the dependence gave a 15th degree polynomial. The calculation of polynomial coefficients showed a great contribution to the duration of ion packets for aberrations of higher order. The discovered features allowed us to suggest a way of the local correction of nearby trajectories in the total ion flux. By correcting the local motion of individual groups of ions, we could reduce temporary aberration to 1–1.6 ns, depending on ion energy. For the time of ion flight ~35 μs, such duration limits the resolution of the analyzer by a value not less than 10000. The real length of ion drift path was about 30 cm. The total overall sizes of the ionoptical system were ~24 × 19 × 5 cm.

Keywords

TOF mass analyzer laser ion source wedge-shaped reflector temporal aberration method of aberration correction resolution 

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    Sysoev, Alexander A., Karpov, A.V., and Gracheva, O.I., Eur. J. Mass Spectrom., 2015, vol. 21, no. 2, p. 103.CrossRefGoogle Scholar
  2. 2.
    Sysoev, Alexander A. and Spakhov, A.V., Phys. Procedia, 2015, vol. 72, p. 208.CrossRefGoogle Scholar
  3. 3.
    Karpov, A.V., Spakhov, A.V., and Sysoev, Alexander A., Eur. J. Mass Spectrom., 2015, vol. 21, no. 6, p. 823.CrossRefGoogle Scholar
  4. 4.
    Karataev, V.I., Mamyrin, B.A., and Shmikk, D.V., Zh. Tekh. Fiz., 1971, vol. 41, no. 7, p. 1498.Google Scholar
  5. 5.
    Sysoev, Alexey A., Chernyshev, D.M., Poteshin, S.S., Karpov, A.V., Fomin, O.I., and Sysoev, Alexander A., Anal. Chem., 2013, vol. 85, no. 19, p. 9003.CrossRefGoogle Scholar
  6. 6.
    Chernyshev, D.M., Poteshin, S.S., Sysoev, Alexander A., and Sysoev, Alexey A., Mass-Spektrom., 2012, vol. 9, no. 1, p. 66.Google Scholar
  7. 7.
    Manura, D.J., SIMION 3D Version 8.0: User Manual: Scientific Instrument Services, Inc. 2007.Google Scholar
  8. 8.
    Sysoev, Alexander A., Voloshko, A.S., and Mikhailov, A.M., Phys. Procedia, 2015, vol. 72, p. 203.CrossRefGoogle Scholar
  9. 9.
    Sysoev, Alexander A., Poteshin, S.S., Kuznetsov, G.B., Kovalyev, I.A., and Yushkov, E.S., J. Anal. Chem., 2002, vol. 57, no. 9, p. 811.CrossRefGoogle Scholar

Copyright information

© Pleiades Publishing, Ltd. 2017

Authors and Affiliations

  • E. A. Sysoeva
    • 1
  • A. V. Spakhov
    • 1
  • Alexander A. Sysoev
    • 1
    Email author
  1. 1.National Research Nuclear University MEPhIMoscowRussia

Personalised recommendations