Skip to main content
SpringerLink
Log in

Benchmarking the Reliability of the Consignments of Semiconductor Articles Using Electrostatic Discharges

  • Electrical Methods
  • Published:
Russian Journal of Nondestructive Testing Aims and scope Submit manuscript

Abstract

Five methods that have been developed by the authors since 2006 for benchmarking the reliability of semiconductor articles using electrostatic discharges are described.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. Lyman, J. and Rosenblatt, D., A special report the driver for quality and reliability. Part 1, Electronics, 1981, no. 10, pp. 125–136.

    Google Scholar 

  2. Ensuring the quality of microelectronic devices. A review of foreign press, Radioelektronika, 1983, pp. 11–34.

  3. Technical Considerations for Controlling ESD in Electronics Manufacturing. Overview of ESD, Associated Risks and Prevention Measures. Technology White Paper, Microscan Systems, Inc., 2011.

  4. Piskun, G.A., Alekseev, V.F., and Bryleva, O.A., Methods for technical diagnostics of microcontrollers subjected to electrostatic discharges, Vestn. Beloruss.-Ross. Univ., 2013, no. 2 (39), pp. 156–163.

    Google Scholar 

  5. Guitard, N., Tremouilles, D., Alves, S., Bafleur, M., Beaudoin, F., Perdu, P., and Wislez, A., ESD induced latent defects in CMOS ICs and reliability impact, Electr. Overstress Electrostatic Discharge (EOS/ESD) Symp., Dallas, United States, 2004, pp. 174–181.

    Google Scholar 

  6. Gorlov, M.I., Vorontsov, I.V., and Andreev, A.V., Effect of electrostatic discharge on semiconductor devices and subsequent annealing of electrostatic defects, Meas. Tech., 1998, vol. 41, no. 1, pp. 65–67.

    Article  Google Scholar 

  7. Gorlov, M.I. and Sergeev, V.A., Sovremennye diagnosticheskie metody kontrolya kachestva i nadezhnosti poluprovodnikovykh izdelii (Current Diagnostic Methods for Testing Quality and Reliability of Semiconductor Articles), Gorlov, M.I., Ed., Ul’yanovsk: Ul’yanovsk State Tech. Univ., 2014.

    Google Scholar 

  8. Gorlov, M.I., Zolotareva, E.A., and Koz’yakov, N.N., A technique for benchmarking the reliability of consignments of semiconductor articles, RF Patent No. 2381514, 2010.

    Google Scholar 

  9. Gorlov, M.I., Smirnov, D.Yu., and Tikhonov, R.M., A technique for benchmarking the reliability of consignments of integrated circuits, RF Patent No. 2386975, 2010.

    Google Scholar 

  10. Gorlov, M.I., Zhukov, D.M., and Denisov, D.A., A technique for benchmarking the reliability of consignments of semiconductor articles, RF Patent No. 2511617, 2014.

    Google Scholar 

  11. Popov, V.N. and Barkanov, N.A., On industrial and design-technology safety margins for IC parameters, Elektron. Tekh., Ser. 8., 1978, no. 7, pp. 43–51.

    Google Scholar 

  12. Zhigal’ski, G.P. and Gal’chenko, V.R., Excess noise and non-linearity as reliability indicators for the electronic devices, Proc. 17th Int. Conf. “Noise and Fluctuation”, August 18–22, 2003, Sikula, J., Ed., Prague: Brno Univ. Technol., 2003, pp. 749–754.

    Google Scholar 

  13. Gorlov, M.I., Antonov, R.N., and Antonova, Ye.A., The effect of X-ray radiation on the electrical parameters and low-frequency noise of digital integral schemes, Russ. J. Nondestr. Test., 2013, vol. 49, no. 5, pp. 278–282.

    Article  Google Scholar 

  14. Gorlov, M.I., Smirnov, D.Yu., and Zhukov, D.M., A technique for benchmarking the reliability of consignments of semiconductor articles, RF Patent No. 2538032, 2015.

    Google Scholar 

  15. Gorlov, M.I., Smirnov, D.Yu., and Tikhonov, R.M., Diagnosing reliability of integrated circuits using noises and the ESD effect, Russ. Microelectron., 2010, vol. 39, no. 1, pp. 19–25.

    Article  Google Scholar 

  16. Gorlov, M.I., Anufriev, L.P., and Dostanko, A.K., Diagnostika tverdotel’nykh struktur po parametram nizkochastotnogo shuma (Diagnostics of Solid-State Structures Based on Low-Frequency Noise Parameters), Minsk: Integralpoligraf, 2006.

    Google Scholar 

  17. Gorlov, M.I., Emel’yanov, A.V., and Plebanovich, V.I., Elektrostaticheskie zaryady v elektronike (Electrostatic Charges in Electronics), Minsk: Bel. Nauka, 2006.

    Google Scholar 

  18. Gorlov, M.I., Zhukov, D.M., and Klyukin, A.A., A technique for benchmarking the reliability of consignments of semiconductor articles, RF Patent No. 2546998, 2015.

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Voronezh State Technical University, Voronezh, 394026, Russia

    M. I. Gorlov, A. V. Strogonov & A. A. Vinokurov

Authors
  1. M. I. Gorlov
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. A. V. Strogonov
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. A. A. Vinokurov
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to M. I. Gorlov.

Additional information

Original Russian Text © M.I. Gorlov, A.V. Strogonov, A.A. Vinokurov, 2018, published in Defektoskopiya, 2018, No. 6, pp. 53–59.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Gorlov, M.I., Strogonov, A.V. & Vinokurov, A.A. Benchmarking the Reliability of the Consignments of Semiconductor Articles Using Electrostatic Discharges. Russ J Nondestruct Test 54, 455–461 (2018). https://doi.org/10.1134/S1061830918060025

Download citation

  • Received:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1134/S1061830918060025

Keywords

Search

Navigation