Skip to main content
Log in

Detection of subsurface microflaws using the high-frequency acoustic microscopy method

  • Acoustic Methods
  • Published:
Russian Journal of Nondestructive Testing Aims and scope Submit manuscript

Abstract

The possibility of detecting subsurface flaws in solids using the scanning high-frequency acoustic-microscopy method was investigated. The influence of a distortion of the focal region and aberrations, which appear during focusing to a subsurface region in a solid, on the formation of the output signal of a microscope is estimated via mathematical simulation of the refraction of focused acoustic beams in a solid and during experiments on a laboratory scanning acoustic microscope at a 400-MHz frequency of probing acoustic waves.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  1. Lemons, R.A. and Quate, C.F., Acoustic microscope — scanning version, Appl. Phys. Lett., 1974, vol. 24, no. 4, pp. 163–165.

    Article  Google Scholar 

  2. Maev, R.G., Akusticheskaya mikroskopiya (Acoustic Microscopy), Moscow: Torus Press, 2005.

    Google Scholar 

  3. Kulakov, M.A. and Morozov, A.I., Visualization of the subsurface structure of objects using an acoustic microscope, Pis’ma Zh. Tekh. Fiz., 1982, vol. 8, no. 12, pp. 719–721.

    Google Scholar 

  4. Korkh, Yu.V., Burkhanov, A.M., and Rinkevich, A.B., Scanning Acoustic Microscope for Visualization of Microflaws in Solids, Russ. J. Nondestr. Test., 2009, no. 10, pp. 677–684.

    Google Scholar 

  5. Kino, G.S., Acoustic Waves: Devices, Imaging, and Analog Signal Processing, Prentice Hall, 2000; Moscow: Mir, 1990.

    Google Scholar 

  6. Jipson, J.B., Acoustic microscopy of interior planes, Appl. Phys. Lett, 1979, vol. 35, no. 5, pp. 385–387.

    Article  Google Scholar 

  7. Howie, A., An introduction to scanning acoustic microscopy, Proc. R. Microsc. Soc., 1987, vol. 22, no. 2, p. 79.

    Google Scholar 

  8. Kanevskii, I.N., Fokusirovanie zvukovykh i ul’trazvukovykh voln (Focusing of Sound and Ultrasonic Waves), Moscow: Nauka, 1977.

    Google Scholar 

  9. Atalar, A., Penetration depth of the scanning acoustic microscope, IEEE Trans. Sonics Ultrason., 1985, vol. 32, no. 2, pp. 164–167.

    Article  Google Scholar 

  10. Brekhovskikh, L.M. and Godin, O.A., Akustika sloistykh sred (Acoustics of Layerd Media), Moscow: Nauka, 1989.

    Google Scholar 

  11. Briggs, G.A.D. and Kolosov, O.V., Acoustic Microscopy, Oxford, New York: Oxford University Press, 2010.

    Google Scholar 

  12. Achenbach, J.D., Wave Propagation in Elastic Solids, Amsterdam, London: North-Holland, 1973.

    Google Scholar 

  13. Brekhovskikh, L.M. and Godin, O.A., Akustika neodnorodnykh sred (Acoustics of Inhomogeneous Media), Moscow: Nauka, 2007, vol. 1.

    Google Scholar 

  14. Lifshits, I.M. and Parkhomovskii, G.D., To the theory of propagation of ultrasonic waves in polycrystals, Zh. Exp. Teor. Fiz., 1950, vol. 20b, no 2, pp 175–182.

    Google Scholar 

  15. Kushibiki, J. and Chubachi, N., Material characterization by line-focus-beam acoustic microscope, IEEE Trans. Sonics Ultrason., 1985, vol. 32, no. 2, pp. 189–212.

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Yu. V. Korkh.

Additional information

Original Russian Text © Yu.V. Korkh, D.V. Perov, A.B. Rinkevich, 2015, published in Defektoskopiya, 2015, Vol. 51, No. 4, pp. 19–33.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Korkh, Y.V., Perov, D.V. & Rinkevich, A.B. Detection of subsurface microflaws using the high-frequency acoustic microscopy method. Russ J Nondestruct Test 51, 198–209 (2015). https://doi.org/10.1134/S1061830915040051

Download citation

  • Received:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1134/S1061830915040051

Keywords

Navigation