Abstract
A method of rapid X-ray analysis is proposed. The content of the method is that the ratio I d/I A i is measured in two channels of a γ spectrometer, one of which is configured for the diffraction maximum of the determined phase (I d) and the other measures the intensity of the spectral line of secondary element A (I A i ), the atomic number of which is the same as that of the material of the X-ray tube anode. Results of the X-ray analysis of chromite and molybdenum are presented. The test rate was 7 min per test. The maximum deviation from the content of MoS2 was 0.4% in standard specimens with concentrations of 24–29% and that of Fe and Cr2O3 was 0.3% for concentrations of 14–19%.
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References
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Original Russian Text © V.I. Bochenin, 2007, published in Defektoskopiya, 2007, Vol. 43, No. 11, pp. 83–87.
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Bochenin, V.I. Quantitative proximate X-ray analysis of loose raw materials based on detection of diffraction and characteristic radiation. Russ J Nondestruct Test 43, 770–773 (2007). https://doi.org/10.1134/S1061830907110095
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DOI: https://doi.org/10.1134/S1061830907110095