Abstract
The method of X-ray phase contrast imaging has found wide application in coherent-synchrotron-radiation sources. In this study, this method is used in combination with X-ray diffraction topography to investigate structural defects and inhomogeneities in the volume of basal-faceted sapphire ribbons. The phase-contrast images of gas pores are analyzed in detail using computer simulations. X-ray topography methods are used to study the generation of dislocations by pores. The combination of methods provides information that is impossible to obtain using traditional optical microscopy.
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ACKNOWLEDGMENTS
We are grateful to Dr. Sci. (Phys.-Math.) I.L. Shulpina (Ioffe Physical—Technical Institute, Russian Academy of Sciences) and Dr. Sci. (Phys.-Math.) M.Yu. Gutkin (Institute of Mechanical Science Problems, Russian Academy of Sciences) for participation in the discussion of the results.
Funding
The study was carried out with financial support of the Ministry of Science and Higher Education of the Russian Federation. T.S. Argunova was supported by grant 075-15-2021-1349. V.G. Kohn was supported by grant 075-15-2021-1362.
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Translated by S. Rostovtseva
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Argunova, T.S., Kohn, V.G., Lim, JH. et al. Study of Structural Defects in Sapphire Ribbons using X-Ray Topography and Coherent Imaging in Synchrotron Radiation. J. Surf. Investig. 17 (Suppl 1), S20–S27 (2023). https://doi.org/10.1134/S1027451023070030
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DOI: https://doi.org/10.1134/S1027451023070030