Skip to main content
Log in

Influence of the Substrate Material on the Structure and Morphological Properties of Bi Films

  • Published:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Aims and scope Submit manuscript

Abstract

Thin Bi films were simultaneously deposited by ultrahigh vacuum evaporation technique on three different substrates: GaAs, sapphire, and quartz. The effect of the substrate on the film microstructure was evaluated. Structural and morphological characterization of these as-deposited Bi films was performed using high resolution X-ray diffraction and scanning electron microscopy. X-ray diffraction analysis revealed the polycrystalline structure of all films with the predominant [003] orientation. The effect of the substrate on the structural quality of Bi films was investigated. Physical parameters such lattice constants, texture coefficient, effective crystallite size, dislocations density and strain were evaluated and widely described. The microscopy images clearly showed a granular structure corresponding to the grain formation on all surfaces of the Bi samples. The density, size, and shape of Bi grains varied greatly depending on the substrate material. Optical measurements of spectral reflectance and spectroscopic ellipsometry were also carried out to confirm the structural characteristics. We associated the different quality of the Bi films with the structure and chemical properties of the substrate.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Fig. 1.
Fig. 2.
Fig. 3.
Fig. 4.
Fig. 5.

Similar content being viewed by others

REFERENCES

  1. X. Yang and D. Wang, ACS Appl. Eng. Mater. 1, 6657 (2018).

    Article  CAS  Google Scholar 

  2. Y. Tian and J. Toudert, J. Nanotechnol. 2018, 3250932 (2018).

    Article  Google Scholar 

  3. J. Yao, Z. Zheng, J. Shao, and G. Yang, ACS Appl. Mater. Interfaces 7, 26701 (2015).

    Article  CAS  Google Scholar 

  4. J. D. Yao, J. M. Shao, and G. W. Yang, Sci. Rep. 5, 12320 (2015).

    Article  CAS  Google Scholar 

  5. M. J. de Castro, F. Cabello, J. Toudert, R. Serna, and E. Haro-Poniatowski, Appl. Phys. Lett. 105, 113102 (2014).

    Article  Google Scholar 

  6. N. Marcano, S. Sangiao, C. Magen, L. Morellon, M. R. Ibarra, M. Plaza, L. Perez, and J. M. D. Teresa, Phys. Rev. B 82, 125326 (2010).

    Article  Google Scholar 

  7. F. Y. Yang, K. Liu, K. Hong, D. H. Reich, P. C. Searson, and C. L. Chien, Science 284, 1335 (1999).

    Article  CAS  Google Scholar 

  8. S. E. Rodil, O. G. Zarco, E. Camps, H. Estrada, M. Lejeune, L. Bourja, and A. Zeinert, Thin Solid Films 636, 384 (2017).

    Article  CAS  Google Scholar 

  9. H. Fitouri, I. Moussa, A. Rebey, and B. El Jani, J. Cryst. Growth 300, 347 (2007).

    Article  CAS  Google Scholar 

  10. C. Li, Z. Q. Zheng, D. S. Fan, Y. Hirono, J. Wu, T. A. Morgan, X. Hu, S. Q. Yu, Zh M. Wang, and G. J. Salamo, Appl. Phys. Lett. 99, 243113 (2011).

    Article  Google Scholar 

  11. X. Du and A. F. Herbard, App. Phys. Lett. 82, 2293 (2003).

    Article  CAS  Google Scholar 

  12. N. Z. E. Sayed, Vacuum 80, 860 (2006).

    Article  Google Scholar 

  13. S. Chander and M. S. Dhaka, Adv. Mater. Lett. 6, 907 (2015).

    Article  CAS  Google Scholar 

  14. A. Kawazu, T. Otsuki, and G. Tominaga, J. App. Phys. 20, 553(1981).

    Article  CAS  Google Scholar 

  15. G. Jnawali, H. Hattab, B. Krenzer, and M. H. V. Hoegen, Phys. Rev. B 74, 195340 (2006).

    Article  Google Scholar 

  16. M. Plaza, M. Abuin, A. Mascaraque, M. A. G. Barrio, and L. Perez, Mater. Chem. Phys. 134, 523 (2012).

    Article  CAS  Google Scholar 

  17. U. Resch, N. Esser, and W. Richter, Surf. Sci. 251–252, 621(1991).

    Article  Google Scholar 

  18. W. K. Ford, T. Guo, K. J. Wan, and C. B. Duke, Phys. Rev. B 45, 11896 (1992).

    Article  CAS  Google Scholar 

  19. J. C. G. Sande, T. Missana, and C. N. Afonso, J. Appl. Phys. 80, 7023 (1996).

    Article  Google Scholar 

  20. A. A. Ramadan, A. M. E. Shabiny, and N. Z. E. Sayed, Thin Solid Films 209, 32(1992).

    Article  CAS  Google Scholar 

  21. T. Ohshima, R. K. Thareja, T. Ikegami, and K. Ebihara, Surf. Coat. Technol. 169–170, 517 (2003).

    Article  Google Scholar 

  22. H. Fitouri, I. Moussa, A. Rebey, A. Fouzri, and B. El Jani, J. Cryst. Growth 295, 114 (2006).

    Article  CAS  Google Scholar 

  23. Z. L. Bao and K. L. Kvanagh, J. Vac. Sci. Technol., B 24, 2138 (2006).

    Article  CAS  Google Scholar 

  24. C. Pariset, Thin Solid Films 91, 301 (1982).

    Article  CAS  Google Scholar 

  25. Z. H. Stachurski, Materials 4, 1564 (2011).

    Article  CAS  Google Scholar 

  26. B. D. Cullity, Elements of X-Ray Diffraction (Addison–Wesley, Reading, MA, 1978).

    Google Scholar 

  27. H. Fitouri, M. M. Habchi, and A. Rebey, High-resolution X-ray diffraction of III–V semiconductor thin films, in X-Ray Scattering, Ed. by A. E. Ares (InTech, 2017). https://doi.org/10.5772/65404

  28. P. M. Vereecken, L. Sun, P. C. Searson, M. Tanase, D. H. Reich, and C. L. Chien, J. Appl. Phys. 88, 6529 (2000).

    Article  CAS  Google Scholar 

  29. P. Scherrer Gottinger Nachrichten, Math. Phys. 2, 98 (1918).

    Google Scholar 

  30. S. Prabahar and M. Dhanam, J. Cryst. Growth 285, 41 (2005).

    Article  CAS  Google Scholar 

  31. W. Schnelle and U. Dillner, Phys. Status Solidi A 44, 197 (1977).

    Article  CAS  Google Scholar 

  32. N. T. Gladkikh, V. I. Larin, and S. A. Maiboroda, Cryst. Res. Technol. 29, 51 (1994).

    Article  CAS  Google Scholar 

  33. V. Kumar, Z. Z. Fang, S. I. Wright, and M. M. Nowell, Metall. Mater. Trans. A 37, 599 (2006).

    Article  Google Scholar 

  34. M. M. Habchi, I. Massoudi, A. Rebey, R. B. Chaâbane, and B. El Jani, J. Cryst. Growth 395, 26 (2014).

    Article  CAS  Google Scholar 

  35. P. M. Vereecken and P. C. Searson, Appl. Phys. Lett. 75, 3135 (1999).

    Article  CAS  Google Scholar 

  36. I. Massoudi and A. Rebey, J. Cryst. Growth 549, 125881 (2020).

    Article  CAS  Google Scholar 

Download references

ACKNOWLEDGMENTS

The authors would like to thank Prof. R.B. Chaabane for sample preparation.

Funding

This work was supported by the Ministry of Higher Education and Scientific Research, Tunisia.

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to A. Rebey.

Ethics declarations

The authors declare that they have no conflicts of interest.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Zouaghi, S., Fitouri, H., Habchi, M.M. et al. Influence of the Substrate Material on the Structure and Morphological Properties of Bi Films. J. Surf. Investig. 16, 783–788 (2022). https://doi.org/10.1134/S1027451022050226

Download citation

  • Received:

  • Revised:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1134/S1027451022050226

Keywords:

Navigation