Abstract
The paper presents a technique for calculating information-correlation characteristics based on the methods of average mutual information and two-dimensional detrended fluctuation analysis. The experimental samples are structures with an array of self-organized InAs/GaAs quantum dots grown without a cover layer by gas-phase epitaxy from metalorganic compounds. The microstructure of the sample surfaces is studied by scanning electron microscopy. The information-correlation characteristics of InAs/GaAs structures with quantum dots are obtained using two-dimensional detrended fluctuation analysis and average mutual information. The order of the array of quantum dots in the InAs/GaAs structure is estimated depending on the applied technological modes of production. It is found that increasing the growth temperature of the experimental samples from 480 to 520°C increases the ordering of the location of quantum dots on the surface.
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ACKNOWLEDGMENTS
The work was carried out using equipment of the Regional Center for Probe Microscopy for Collective Use at Ryazan State Radio Engineering University.
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Rybina, N.V., Zdoroveyschev, A.V. & Rybin, N.B. Investigation of the Features of InAs/GaAs Structures with Quantum Dots by Information-Correlation Characteristics. J. Surf. Investig. 15, 384–388 (2021). https://doi.org/10.1134/S1027451021020312
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DOI: https://doi.org/10.1134/S1027451021020312