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Determination of the Bonding State of the Modified Surface of Polyetheretherketone by the Principal Component Analysis of X-Ray Photoelectron C 1s Spectra

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Abstract

Principal component analysis in a dual formulation is proposed to interpret changes in the C 1s X‑ray photoelectron spectra, arising from modification of the surface of polyetheretherketone. The distribution of the spectral intensities considered together with the spectra on dual graphs is used to construct a model of the peak structure of the C 1s spectra for their subsequent decomposition into components. It is shown that after treatment of the surface of polyetheretherketone with accelerated ion and neutral beams of argon-atom clusters, 288.3- and 285.5-eV peaks appear in the C 1s spectra, which characterize the presence of carboxyl functional groups and aliphatic carbon atoms in the modified surface layer.

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Funding

The work was supported by the Ministry of Higher Education and Science (project code RFMEFI57417X0136. Agreement 14.574.21.0136).

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Authors and Affiliations

  1. Institute of Microelectronics Technology and High Purity Materials, Russian Academy of Sciences, 142432, Chernogolovka, Moscow oblast, Russia

    V. G. Beshenkov

  2. MIREA–Russian Technological University, 119571, Moscow, Russia

    S. M. Pestov

Authors
  1. V. G. Beshenkov
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  2. S. M. Pestov
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Correspondence to V. G. Beshenkov.

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Translated by L. Chernikova

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Beshenkov, V.G., Pestov, S.M. Determination of the Bonding State of the Modified Surface of Polyetheretherketone by the Principal Component Analysis of X-Ray Photoelectron C 1s Spectra. J. Surf. Investig. 15, 46–51 (2021). https://doi.org/10.1134/S1027451021010055

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  • DOI: https://doi.org/10.1134/S1027451021010055

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