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On the Atomic-Force Microscopy and Electrical Properties of Single-Crystal Bismuth Films

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Abstract—A method for creating single-crystal bismuth films by melting and subsequent normal directed crystallization without a seed under a protective coating in a nitrogen atmosphere is proposed and tested. The high quality of the crystal structure of these films is confirmed by atomic-force microscopy and X-ray diffraction analysis. The specific resistance, magnetoresistance, and Hall coefficient are measured in the temperature range of 77–300 K. The electrical and galvanomagnetic coefficients of single-crystal bismuth films are compared with similar coefficients for block bismuth films created by thermal evaporation in vacuum. The mobilities of electrons and holes are determined in the temperature range 77–300 K for the studied structures.

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REFERENCES

  1. E. V. Demidov, V. M. Grabov, V. A. Komarov, A. N. Krushelnitckii, A. V. Suslov, and M. V. Suslov, Semiconductors 53, 727 (2019). https://doi.org/10.1134/S1063782619060046

    Article  CAS  Google Scholar 

  2. V. M. Grabov, E. V. Demidov, and V. A. Komarov, J. Surf. Invest.: X-ray, Synchrotron Neutron Tech. 5, 177 (2011).

    Article  CAS  Google Scholar 

  3. V. M. Grabov, E. V. Demidov, V. A. Komarov, and N. I. Kiseleva, Termoelektrichestvo, No. 4, 73 (2011).

  4. W. Schnelle and U. Dillner, Phys. Status Solidi A 115 (2), 505 (1989). https://doi.org/10.1002/pssa.2211150218

    Article  CAS  Google Scholar 

  5. V. M. Grabov, E. V. Demidov, V. A. Komarov, D. Yu. Matveev, A. A. Nikolaeva, D. Markushevs, E. V. Konstantinov, and E. E. Konstantinova, Semiconductors 48, 630 (2014).

    Article  CAS  Google Scholar 

  6. K. S. Wu and M. Y. Chern, Thin Solid Films 516 (12), 3808 (2008). https://doi.org/10.1016/j.tsf.2007.06.138

    Article  CAS  Google Scholar 

  7. K. S. Wu and M. Y. Chern, J. Appl. Phys. 104, 033704 (2008). https://doi.org/10.1063/1.2957055

    Article  CAS  Google Scholar 

  8. V. M. Grabov, V. A. Komarov, N. S. Kablukova, E. V. Demidov, and A. N. Krushel’nitskii, Tech. Phys. Lett. 41, 10 (2015).

    Article  CAS  Google Scholar 

  9. E. V. Demidov, V. A. Komarov, A. N. Krushelnitckii, and A. V. Suslov, Semiconductors 51, 840 (2017). https://doi.org/10.1134/S1063782617070065

    Article  CAS  Google Scholar 

  10. V. M. Grabov, V. A. Komarov, E. V. Demidov, and M. M. Klimantov, Izv. Ros. Gos. Ped. Univ. Gertsena, No. 122, 22 (2010).

    Google Scholar 

  11. V. M. Grabov, E. V. Demidov, V. A. Komarov, M. M. Klimantov, D. Yu. Matveev, S. V. Slepnev, E. V. Usynin, E. E. Khristich, and E. V. Konstantinov, Izv. Ros. Gos. Ped. Univ. Gertsena. No. 95, 105 (2009).

    Google Scholar 

  12. V. A. Komarov, M. M. Klimantov, M. M. Loguntsova, S. N. Pylina, and E. V. Demidov, Izv. Ros. Gos. Ped. Univ. Gertsena, Fiz. Nauch. Zh. 6 (15), 131 (2006).

    Google Scholar 

  13. V. A. Komarov, V. M. Grabov, A. V. Suslov, N. S. Kablukova, and M. V. Suslov, Semiconductors 53, 593 (2019). https://doi.org/10.1134/S1063782619050105

    Article  CAS  Google Scholar 

  14. R. H. Zitter, Phys. Rev. 127, 1471 (1962). https://doi.org/10.1103/PhysRev.127.1471

    Article  CAS  Google Scholar 

  15. V. M. Grabov, V. A. Komarov, E. V. Demidov, and E. E. Khristich, Mold. J. Phys. Sci. 10 (1), 87 (2011).

    Google Scholar 

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FUNDING

The study was financially supported by the Russian Foundation for Basic Research, project no. 18-32-00242.

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Authors and Affiliations

  1. Herzen State Pedagogical University of Russia, 191186, St. Petersburg, Russia

    V. M. Grabov, V. A. Gerega, E. V. Demidov, V. A. Komarov, A. V. Suslov & M. V. Suslov

  2. National Research Center “Kurchatov Institute”–Prometey–Central Scientific Research Institute of Structural Materials, 191015, St. Petersburg, Russia

    M. V. Starytsin

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  1. V. M. Grabov
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  2. V. A. Gerega
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  4. V. A. Komarov
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  5. M. V. Starytsin
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  6. A. V. Suslov
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  7. M. V. Suslov
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Correspondence to E. V. Demidov.

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Grabov, V.M., Gerega, V.A., Demidov, E.V. et al. On the Atomic-Force Microscopy and Electrical Properties of Single-Crystal Bismuth Films. J. Surf. Investig. 14, 913–917 (2020). https://doi.org/10.1134/S1027451020050055

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  • DOI: https://doi.org/10.1134/S1027451020050055

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