Diagnostics of the Phase Composition of Lead-Zirconate-Titanate Films by Raman Spectroscopy

  • V. G. Beshenkov
  • A. G. Znamenskii
  • A. V. Irzhak
  • V. A. Marchenko


The problem of diagnostics of the phase composition of lead-zirconate-titanate (PZT) layers under conditions of overlapped Raman spectra is solved by means of applied mathematical statistics. The spectra measured on the surface of the multiphase material are treated as points in multidimensional vector spaces. Particular attention is paid to narrowing of the spectral range where the analysis is carried out. For this purpose, regions for the first principal components are used, where the greatest relative changes are observed. The concentration of the perovskite and pyrochlore phases in the growing PZT films is determined.


Raman spectroscopy peak overlapping principal component analysis 


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  1. 1.
    V. G. Beshenkov, A. F. Vyatkin, A. G. Znamenskii, et al., J. Surf. Invest.: X-ray, Synchrotron Neutron Tech. 2 (1), 25 (2008).Google Scholar
  2. 2.
    G. Burns and B. A. Scott, Phys. Rev. Lett. 25, 1191 (1970).CrossRefGoogle Scholar
  3. 3.
    G. Burns and B. A. Scott, Phys. Rev. B 7, 3088 (1973).CrossRefGoogle Scholar
  4. 4.
    I. Taguchi, A. Pignolet, L. Wang, et al., J. Appl. Phys. 74, 6625 (1993).CrossRefGoogle Scholar
  5. 5.
    F. A. G. Souza, K. C. V. Lima, A. P. Ayala, et al., Phys. Rev. B 66, 132107 (2002).CrossRefGoogle Scholar
  6. 6.
    J. Lappalainen, J. Frantti, J. Hiltunen, et al., Ferroelectrics 335, 149 (2006).CrossRefGoogle Scholar
  7. 7.
    R. Merlin, J. A. Sanjurjo, and A. Pinczuk, Solid State Commun. 16, 931 (1975).CrossRefGoogle Scholar
  8. 8.
    V. N. Detsik, E. Yu. Kaptelov, S. A. Kukushkin, et al., Fiz. Tverd. Tela 39 (1), 121 (1997).Google Scholar
  9. 9.
    I. P. Pronin, E. Yu. Kaptelov, S. V. Senkevich, et al., Phys. Solid State 52 (1), 132 (2010).CrossRefGoogle Scholar
  10. 10.
    S. A. Aivazyan, V. M. Bukhshtaber, I. S. Yenyukov, and L. D. Meshalkin, Applied Statistics: Classification and Dimensionality Reduce (Finansy i Statistika, Moscow, 1989) [in Russian].Google Scholar
  11. 11.
    Handbook of Applicable Mathematics, Vol. 6, Part B: Statistics, Ed. by E. Lloyd and W. Ledermann (John Wiley and Sons, New York, 1984).Google Scholar
  12. 12.
    V. G. Beshenkov, A. A. Burlakov, A. G. Znamenskii, et al., Tech. Phys. Lett. 40 (8), 644 (2014).CrossRefGoogle Scholar

Copyright information

© Pleiades Publishing, Ltd. 2018

Authors and Affiliations

  • V. G. Beshenkov
    • 1
  • A. G. Znamenskii
    • 1
  • A. V. Irzhak
    • 1
  • V. A. Marchenko
    • 1
  1. 1.Institute of Microelectronics Technology and High Purity MaterialsRussian Academy of SciencesChernogolovka, Moscow oblastRussia

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