Investigations of the Growth Processes of Bismuth-Germanate Crystals (Bi12GeO20) from the Melt using the X-Ray Diffraction Characteristics of Natural Lateral Faces
Single crystals of bismuth-germanate grown by the Czochralski method and possessing a combination of piezoelectric, electro-optical and magneto-optical characteristics are studied. The possibility of the non-destructive quality control of the grown crystals by X-ray diffraction investigation of their natural lateral faces is shown.
Keywordscrystal growth bismuth germanate Czochralski method X-ray diffraction methods rocking curve
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- 2.Yu. F. Kargin, Doctoral Dissertation in Chemistry (Kurnakov Institute of General and Inorganic Chemistry Russ. Acad. Sci., Moscow, 1998).Google Scholar
- 3.E. I. Speranskaya and A. A. Arshakuni, Zh. Neorg. Khim. 9 (2), 414 (1964).Google Scholar
- 4.V. V. Volkov, Yu. F. Kargin, N. I. Nelyapina, and V. M. Skorikov, Zh. Neorg. Khim. 34 (12), 3131 (1989).Google Scholar
- 5.D. K. Bowen and B. K. Tanner, High Resolution X-ray Diffractometry and Topography (Taylor & Francis, London, 1998).Google Scholar
- 6.V. V. Lider, Phase-Sensitive X-ray Methods for Characterizing Condensed Media. Student’s Book (A. V. Shubnikov Institute of Crystallography Russ. Acad. Sci., Moscow, 2009) [in Russian].Google Scholar
- 7.M. V. Koval’chuk, E. K. Kov’ev, A. V. Mirenskii, and Yu. N. Shilin, Prib. Tekh. Eksp., No. 4, 203 (1975).Google Scholar