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Discrete Fourier analysis of images of structural defects in single crystals

Abstract

The absolute value and argument of discrete Fourier transform (DFT) coefficients are investigated by analyzing images of test objects and structural defects in single crystals, which are theoretically calculated from modified Indenbom–Chamrov equations and experimental data. The role of the argument of DFT coefficients is demonstrated in revealing the peculiarities of the contrast generated by structural defects and their reliable identification and localization in the bulk of a single crystal.

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Correspondence to V. A. Tkal.

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Original Russian Text © I.A. Zhukovskaya, V.A. Bushuev, V.A. Tkal, 2016, published in Poverkhnost’. Rentgenovskie, Sinkhrotronnye i Neitronnye Issledovaniya, 2016, No. 2, pp. 76–85.

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Zhukovskaya, I.A., Bushuev, V.A. & Tkal, V.A. Discrete Fourier analysis of images of structural defects in single crystals. J. Synch. Investig. 10, 231–240 (2016). https://doi.org/10.1134/S1027451015060403

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  • DOI: https://doi.org/10.1134/S1027451015060403

Keywords

  • X-ray topography
  • defect imaging
  • theoretical and experimental contrasts
  • test objects
  • Fourier analysis
  • digital image processing