Skip to main content
SpringerLink
Log in

Intrinsic excitation effect for the Al and Mg samples XPS analysis

  • Published:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques Aims and scope Submit manuscript

Abstract

DIIMFP extraction method based on the numerical solution of electron scattering is presented. DIIMFP data extracted from Reflected Electron Energy Loss Spectra (REELS) is used for Photoelectron spectroscopy (PES) calculations. Experimental data can be described accurately without any intrinsic excitation effect. Authors propose that intrinsic energy losses were introduced to face inaccuracies due to inadequate description of electron energy loss process.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. A. Jablonski, F. Salvat, and C. J. Powell, NIST Electron Elastic Scattering Cross Section Database, Version 3.2, Standard Reference Data Program Database No. 64. http://www.nist.gov/srd/nist64.cfm

  2. F. Ybero and S. Tougaard, Phys. Rev. B 71, 045414 (2005)

    Article  Google Scholar 

  3. C. Biswas, A. K. Shukla, S. Banik, V. K. Ahire, and S. R. Barman, Phys. Rev. B 67, 165416 (2003).

    Article  Google Scholar 

  4. V. P. Afanas’ev and A. V. Lubenchenko, Surf. Invest. 13, 1087 (1998).

    Google Scholar 

  5. V. P. Afanas’ev, A. V. Lubenchenko, and M. K. Gubkin, Europhys. J. B 37, 117 (2004).

    Google Scholar 

  6. V. P. Afanas’ev, D. S. Efremenko, D. A. Ivanov, P. S. Kaplya, and A. V. Lubenchenko, J. Surf. Invest.: X-ray, Synchrotron Neutron Tech. 7, 382 (2012).

    Article  Google Scholar 

  7. V. P. Afanas’ev, P. S. Kaplya, A. V. Lubenchenko, and O. I. Lubenchenko, Vacuum 105, 96 (2014).

    Article  Google Scholar 

  8. M. Trzhaskovskaya, V. Nefedov, and Y. Yarzhemsky, At. Data Nucl. Data Tables 77, 97 (2001).

    Article  Google Scholar 

  9. S. Tougaard and I. Chorkendorff, Phys. Rev. B 35, 6570 (1987).

    Article  Google Scholar 

  10. P. M. Th. M. van Attekum, and J. M. Trooster, Phys. Rev. B 20, 2335 (1979).

    Article  Google Scholar 

  11. C. Wagner, W. Riggs, L. Davis, and J. Moulder, Handbook of X-ray Photoelectron Spectroscopy (Perkin-Elmer Corporation, Phys. Electron. Div., USA, 1992).

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. National Research University “Moscow Power Engineering Institute,”, st. Krasnokazarmennaya 14, Moscow, 111250, Russia

    V. P. Afanas’ev, A. S. Gryazev, P. S. Kaplya & Y. O. Andreyeva

Authors
  1. V. P. Afanas’ev
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. A. S. Gryazev
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. P. S. Kaplya
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. Y. O. Andreyeva
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to A. S. Gryazev.

Additional information

The article is published in the original.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Afanas’ev, V.P., Gryazev, A.S., Kaplya, P.S. et al. Intrinsic excitation effect for the Al and Mg samples XPS analysis. J. Surf. Investig. 10, 108–112 (2016). https://doi.org/10.1134/S102745101506004X

Download citation

  • Received:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1134/S102745101506004X

Keywords

Search

Navigation