Abstract
Experimental and theoretical studies are performed to characterize the X-ray reflection spectra obtained in the case of the grazing incidence of monochromatic radiation on the plane surface of single- and polycrystalline quartz samples and the channel walls of microchannel plates. It is established that the theoretically calculated fine structures of the X-ray spectra and those measured with a high resolution are closely coincident at energies corresponding to an anomalous dispersion region near the SiL 2,3 absorption edge. Theoretical calculations are carried out using a model involving a transition layer on a sample surface.
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Original Russian Text © M.I. Mazuritskiy, A.A. Novakovich, 2014, published in Poverkhnost’. Rentgenovskie, Sinkhrotronnye i Neitronnye Issledovaniya, 2014, No. 12, pp. 57–62.
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Mazuritskiy, M.I., Novakovich, A.A. Surface transition-layer model used to study the fine structure of X-ray reflection spectra. J. Surf. Investig. 8, 1291–1296 (2014). https://doi.org/10.1134/S1027451014060354
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DOI: https://doi.org/10.1134/S1027451014060354