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Virtual scanning electron microscope: 1. Objectives and tasks of virtual measuring instruments

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Abstract

Virtual measuring instruments, as well as their operation, are described during measurement of the characteristics of the objects under study. Their objectives and tasks are discussed in proving the correctness of solving incorrect inverse problems. It is demonstrated that a virtual scanning electron microscope must inevitably be created to solve various problems of micro- and nanotechnologies.

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References

  1. International Technology Roadmap for Semiconductors, 2013 Edition. Metrology. 2013. 42 p. // public.itrs.net

  2. M. T. Postek and A. E. Vladar, in Handbook of Silicon Semiconductor Metrology, Ed. by A. C. Diebold (Marcel Dekker, New York, Basel, 2001), p. 295.

  3. Yu. A. Novikov and A. V. Rakov, Russ. Microelectron. 25, 368 (1996).

    Google Scholar 

  4. T. Hatsuzawa, K. Toyoda, and Y. Tanimura, Rev. Sci. Instrum. 61, 975 (1990).

    Article  Google Scholar 

  5. Yu. A. Novikov and A. V. Rakov, Surf. Invest., No. 8, 1177 (2000).

    Google Scholar 

  6. Yu. A. Novikov and A. V. Rakov, in Mechanisms of Secondary Electron Emission from a Relief Surface of Solids, Moscow: Nauka, Fizmatlit, 1998, pp. 3–99. (Proc. IOFAN, Vol. 55) [in Russian].

    Google Scholar 

  7. Ch. P. Volk, E. S. Gornev, Yu. A. Novikov, Yu. V. Ozerin, Yu. I. Plotnikov, A. M. Prokhorov, and A. V. Rakov, Russ. Microelectron. 31, 207 (2002).

    Article  Google Scholar 

  8. Yu. A. Novikov, V. P. Gavrilenko, Yu. V. Ozerin, A. V. Rakov, and P. A. Todua, Proc. SPIE 6648, 66480R-1 (2007).

    Article  Google Scholar 

  9. Ch. P. Volk, E. S. Gornev, Yu. A. Novikov, Yu. V. Ozerin, Yu. I. Plotnikov, and A. V. Rakov, Russ. Microelectron. 33, 342 (2004).

    Article  Google Scholar 

  10. V. P. Gavrilenko, V. A. Kalnov, Yu. A. Novikov, A. A. Orlikovsky, A. V. Rakov, P. A. Todua, K. A. Valiev, and E. N. Zhikharev, Proc. SPIE 7272, 727227-1 (2009).

    Google Scholar 

  11. M. A. Danilova, V. B. Mityukhlyaev, Yu. A. Novikov, Yu. V. Ozerin, A. V. Rakov, and P. A. Todua, Meas. Tech. 51, 839 (2008).

    Article  Google Scholar 

  12. V. P. Gavrilenko, Yu. A. Novikov, A. V. Rakov, and P. A. Todua, Nanoindustriya, No. 4, 36 (2009) [in Russian].

    Google Scholar 

  13. V. P. Gavrilenko, Yu. A. Novikov, A. V. Rakov, and P. A. Todua, Proc. SPIE 7405, 740504-1 (2009).

    Google Scholar 

  14. V. P. Gavrilenko, E. N. Lesnovsky, Yu. A. Novikov, A. V. Rakov, P. A. Todua, and M. N. Filippov, Bull. Russ. Acad. Sci.: Phys. 73, 433 (2009).

    Article  Google Scholar 

  15. V. P. Gavrilenko, M. N. Filippov, Yu. A. Novikov, A. V. Rakov, and P. A. Todua, Proc. SPIE 7378, 737812-1 (2009).

    Google Scholar 

  16. V. P. Gavrilenko, M. N. Filippov, Yu. A. Novikov, A. V. Rakov, and P. A. Todua, Proc. SPIE 6648, 66480T-1 (2007).

    Article  Google Scholar 

  17. Ch. P. Volk, V. B. Mityukhlyaev, Yu. A. Novikov, A. V. Rakov, and P. A. Todua, Meas. Tech. 52, 713 (2009).

    Article  Google Scholar 

  18. Yu. A. Novikov, A. V. Rakov, and P. A. Todua, Meas. Tech. 52, 142 (2009).

    Article  Google Scholar 

  19. Yu. A. Novikov, A. V. Rakov, and M. N. Filippov, Bull. Russ. Acad. Sci.: Phys. 62, 439 (1998).

    Google Scholar 

  20. I. N. Silin, FUMILI, CERN Program Library, D510 (1983).

    Google Scholar 

  21. Ch. P. Volk, E. S. Gornev, Yu. A. Novikov, Yu. I. Plotnikov, A. V. Rakov, and P. A. Todua, in Linear Measurements in Micrometer and Nanometer Ranges for Microelectronics and Nanotechnology, Moscow: Nauka, 2006, p. 77. (Proc. IOFAN, Vol. 62) [in Russian].

    Google Scholar 

  22. V. P. Gavrilenko, Yu. A. Novikov, A. V. Rakov, and P. A. Todua, Proc. SPIE 7042, 70420C-1 (2008).

    Article  Google Scholar 

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Novikov, Y.A. Virtual scanning electron microscope: 1. Objectives and tasks of virtual measuring instruments. J. Surf. Investig. 8, 1244–1251 (2014). https://doi.org/10.1134/S1027451014060123

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  • DOI: https://doi.org/10.1134/S1027451014060123

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