Abstract
The surface morphology and the degree of porosity of metal-polymer films deposited by the electrolytic method are studied using scanning electron microscopy (SEM) and X-ray fluorescence (XRF) spectroscopy. Mathematical processing is performed, and the structure of the sample surfaces is analyzed using images obtained in the mode of secondary-electron recording. The volume-packing coefficients for heterogeneous coatings are determined using the XRF analysis data. The dependence of the surface structure and volume-packing coefficient of copper in the film on the polymer type and the coating thickness is established.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
L. M. Skibina, V. V. Kuznetsov, A. I. Sokolenko, et al., Fizikokhim. Poverkhn. Zashch. Mater. 45(1), 78 (2009).
V. A. Smirnov, E. A. Sukholentsev, V. V. Kuznetsov, et al., Zashch. Met. 28, 811 (1992).
L. M. Skibina, E. I. Burdina, and A. I. Sokolenko, Fizikokhim. Poverkhn. Zashch. Mater. 48, 385 (2012).
V. V. Kuznetsov, L. M. Skibina, E. F. Kuznetsova, et al., Zashch. Met. 41, 463 (2005).
V. V. Kuznetsov, L. M. Skibina, E. F. Kuznetsova, and I. N. Loskutnikova, Zashch. Met. 42, 632 (2006).
L. M. Skibina, A. I. Sokolenko, and E. I. Burdina, Fizikokhim. Poverkhn. Zashch. Mater. 47, 502 (2011).
Scientific and Technical Databases, National Institute of Standards and Technology (NIST). http://phys-ics.nist.gov/PhysRefData/FFast/html/form.html
A. D. Pogrebnyak, A. A. Drobyshevskaya, V. M. Beresnev, et al., Tech. Phys. 56, 1023 (2011).
V. M. Kashkarov, A. S. Len’shin, P. V. Seredin, et al., J. Surf. Invest.: X-Ray, Synchrotron Neutron Tech. 6, 776 (2012).
D. A. Romanov, E. A. Budovskikh, and V. E. Gromov, J. Surf. Invest.: X-Ray, Synchrotron Neutron Tech. 5, 1112 (2011).
V. I. Vasil’eva, N. A. Kranina, M. D. Malykhin, et al., J. Surf. Invest.: X-Ray, Synchrotron Neutron Tech. 7, 144 (2013).
J. Goldstein, D. Newbury, P. Echlin, et al., Scanning Electron Microscopy and X-Ray Microanalysis (Plenum, New York, 1981).
D. A. Sakseev, E. M. Ershenko, S. V. Baryshev, et al., Tech. Phys. 56, 127 (2011).
G. V. Pavlinskii, Basic Physics of X-Rays (Fizmatlit, Moscow, 2007) [in Russian].
P. Pistor, I. Kotschau, A. Grimm, et al., J. Synchrotr. Rad. 17, 791 (2010).
P. F. Berry, T. Furuta, and J. R. Rhodes, Adv. X-Ray Anal. 12, 612 (1969).
Sh. I. Duimakaev, M. I. Mazuritskiy, O. I. Barteneva, et al., Zavod. Lab. Diagn. Mater. 78(12), 29 (2012).
N. F. Losev, Quantitative X-Ray Spectral Fluorescent Analysis (Nauka, Moscow, 1969) [in Russian].
Author information
Authors and Affiliations
Corresponding author
Additional information
Original Russian Text © M.I. Mazuritskiy, Sh.I. Duimakaev, L.M. Skibina, 2014, published in Poverkhnost’. Rentgenovskie, Sinkhrotronnye i Neitronnye Issledovaniya, 2014, No. 8, pp. 38–45.
Rights and permissions
About this article
Cite this article
Mazuritskiy, M.I., Duimakaev, S.I. & Skibina, L.M. SEM and XRF spectroscopy methods for studying and controlling the surface morphology of metal-polymer films. J. Surf. Investig. 8, 767–774 (2014). https://doi.org/10.1134/S1027451014040284
Received:
Published:
Issue Date:
DOI: https://doi.org/10.1134/S1027451014040284