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X-ray photoelectron spectroscopy: Exact solution to the problem with internal sources

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Abstract

A fundamentally new model of multiple photoelectron scattering in solids is described in this paper. It takes into account the nonuniform depth distribution of photoelectron sources and the anisotropic character of single scattering and yields an exact solution to the problem of multiple elastic scattering. Highly accurate and fast algorithms for calculating X-ray photoelectron spectroscopy signals can be developed on the basis of this model.

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Authors and Affiliations

  1. National Research Institute Moscow Power Engineering Institute, Moscow, 111250, Russia

    V. P. Afanas’ev, D. A. Ivanov, P. S. Kaplya & A. V. Lubenchenko

Authors
  1. V. P. Afanas’ev
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  2. D. A. Ivanov
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  3. P. S. Kaplya
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  4. A. V. Lubenchenko
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Corresponding author

Correspondence to V. P. Afanas’ev.

Additional information

Original Russian Text © V.P. Afanas’ev, D.A. Ivanov, P.S. Kaplya, A.V. Lubenchenko, 2013, published in Poverkhnost’. Rentgenovskie, Sinkhrotronnye i Neitronnye Issledovaniya, 2013, No. 8, pp. 57–62.

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Afanas’ev, V.P., Ivanov, D.A., Kaplya, P.S. et al. X-ray photoelectron spectroscopy: Exact solution to the problem with internal sources. J. Surf. Investig. 7, 756–761 (2013). https://doi.org/10.1134/S1027451013040265

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  • DOI: https://doi.org/10.1134/S1027451013040265

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