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Diagnostics of height distribution of InAs/GaAs quantum dot arrays by means of carbon tetrachloride treatment in vapor phase epitaxy conditions

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Abstract

A technique for determination of InAs quantum dots bimodal distribution has been developed. This technique is based on vapor-chemical etching of quantum dot arrays coated with thin GaAs layers and on combined investigation of the morphology and photoluminescence spectra of etched quantum-size structures. It has been shown that, in some growth modes of quantum-size heterostructures by metal-organic vapor phase epitaxy, bimodal arrays of large and small quantum dots are formed. The surface concentration of large and small dots has been established to be about 2 × 109 and 3 × 1010 cm−2, respectively.

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Correspondence to A. V. Zdoroveishev.

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Original Russian Text © A.V. Zdoroveishev, P.B. Demina, I.A. Karpovich, 2011, published in Poverkhnost’. Rentgenovskie, Sinkhrotronnye i Neitronnye Issledovaniya, No. 1, pp. 62–65.

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Zdoroveishev, A.V., Demina, P.B. & Karpovich, I.A. Diagnostics of height distribution of InAs/GaAs quantum dot arrays by means of carbon tetrachloride treatment in vapor phase epitaxy conditions. J. Surf. Investig. 5, 57–59 (2011). https://doi.org/10.1134/S1027451011010204

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  • DOI: https://doi.org/10.1134/S1027451011010204

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