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The use of asymmetric reflection for control of the effective distance between monochromator and X-ray source

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Abstracts

Formulae of the dependence of the effective distance between an asymmetric crystal monochromator and an X-ray source on the monochromator’s asymmetry parameter have been obtained for the cases of characteristic and synchrotron radiations.

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Original Russian Text © V.V. Lider, 2009, published in Poverkhnost’. Rentgenovskie, Sinkhrotronnye i Neitronnye Issledovaniya, No. 12, pp. 40–42.

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Lider, V.V. The use of asymmetric reflection for control of the effective distance between monochromator and X-ray source. J. Surf. Investig. 3, 933–935 (2009). https://doi.org/10.1134/S1027451009060159

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  • DOI: https://doi.org/10.1134/S1027451009060159

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