Abstract
Examples of the errors that arose under the studies of metric characteristics of micro- and nanoobjects with atomic force microscopy (AFM) are presented. Degradation of the tip of the probe both under successive scanning of the same part of a sample surface and in the course of a single scan is revealed. AFM images acquired with the probe having twin apexes located at different levels are demonstrated.
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Original Russian Text © N.G. Tsirkunova, V.E. Borisenko, L.V. Kukharenko, M.V. Gol’tsev, S.A. Chizhik, 2009, published in Poverkhnost’. Rentgenovskie, Sinkhrotronnye i Neitronnye Issledovaniya, No. 9, pp. 82–85.
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Tsirkunova, N.G., Borisenko, V.E., Kukharenko, L.V. et al. The influence of a probe on topographical images in atomic force microscopy. J. Surf. Investig. 3, 730–733 (2009). https://doi.org/10.1134/S1027451009050127
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DOI: https://doi.org/10.1134/S1027451009050127