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Processing and identification of field-emission images of metallic surfaces

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Abstract

Techniques and algorithms for recording and processing field-emission images have been proposed. An original method of identifying individual crystal faces and directions in the surface structure based on fieldemission images and information on the emitter lattice type is described. The results may be used for detailed investigation of field electron emission under various impacts on the metallic surface.

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Authors and Affiliations

  1. St. Petersburg State University, Universitetskaya nab. 7/9, St. Petersburg, 199034, Russia

    N. V. Egorov & A. G. Karpov

  2. National Taiwan University of Science and Technology, Keelung Road, 43, Sec. 4, Taipei, 106, Taiwan, Republic of China

    Che-Chou Shen

Authors
  1. N. V. Egorov
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  2. A. G. Karpov
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  3. Che-Chou Shen
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Additional information

Original Russian Text © N.V. Egorov, A.G. Karpov, Che-Chou Shen, 2009, published in Poverkhnost’. Rentgenovskie, Sinkhrotronnye i Neitronnye Issledovaniya, No. 2, pp. 97–103.

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Egorov, N.V., Karpov, A.G. & Shen, CC. Processing and identification of field-emission images of metallic surfaces. J. Surf. Investig. 3, 165–171 (2009). https://doi.org/10.1134/S1027451009010273

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  • DOI: https://doi.org/10.1134/S1027451009010273

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