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Effect of the band structure of energy levels on the angular distribution of diffracted X-ray radiation for positron plane channeling in silicon

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Abstract

It is shown that the inclusion of the band structure of energy levels of channeled positrons (as in the case of electrons) leads to a qualitative change in the angular distribution of X-ray radiation.

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Correspondence to O. V. Bogdanov.

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Original Russian Text © O.V. Bogdanov, K.B. Korotchenko, Yu.L. Pivovarov, 2008, published in Poverkhnost’. Rentgenovskie, Sinkhrotronnye i Neitronnye Issledovaniya, No. 4, pp. 35–41.

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Bogdanov, O.V., Korotchenko, K.B. & Pivovarov, Y.L. Effect of the band structure of energy levels on the angular distribution of diffracted X-ray radiation for positron plane channeling in silicon. J. Surf. Investig. 2, 290–296 (2008). https://doi.org/10.1134/S1027451008020249

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  • DOI: https://doi.org/10.1134/S1027451008020249

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