Abstract
The molecular dynamics method is used to study the drift of Li+ ions exposed to electric interactions in a planar channel formed by silicene sheets. The character of dynamics of the ion and also its effect on mechanical properties of silicene sheets are used to determine the optimum size of the planar channel clearance. Instability of the surface (4 × 4) structure of free bilayer silicene is demonstrated. Mobilities of Si atoms and distributions of the main stresses in silicene appearing in the course of lithium ion movement along the channel are calculated.
Similar content being viewed by others
References
Galashev, A.E., Polukhin, V.A., Izmodenov, I.A., and Rakhmanova, O.R., Glass Physics and Chemistry, 2006, vol. 32, p. 99.
Galashev, A.E., Polukhin, V.A., Izmodenov, I.A., and Rakhmanova, O.R., Glass Physics and Chemistry, 2007, vol. 33, p. 86.
Galashev, A.E., Izmodenov, I.A., Novruzov, A.N., and Novruzova, O.A., Semiconductors, 2007, vol. 41, p. 190.
Cahangirov, S., Topsakal, M., Aktüurk, E., Sahin, H., and Ciraci, S., Phys. Rev. Lett., 2009, vol. 102, p. 236804.
Vogt, P., DePadova, P., Quaresima, C., Avila, J., Frantzeskakis, E., Asensio, M.C., Resta, A., Ealet, B., and LeLay, G., Phys. Rev. Lett., 2012, vol. 108, p. 155501.
Feng, B., Ding, Z., Meng, S., Yao, Y., He, X., Cheng, P., Chen, L., and Wu, K., NanoLett., 2012, vol. 12, p. 3057.
Chen, L., Liu, C.C., Feng, B., He, X., Cheng, P., Ding, Z., Meng, S., Yao, Y., and Wu, K., Phys. Rev. Lett., 2012, vol. 109, p. 056804.
Bechstedt, F., Matthes, L., Gori, P., and Pulci, O., Appl. Phys. Lett., 2012, vol. 100, p. 261906.
Kang, J., Wu, F.M., and Li, J.B., Appl. Phys. Lett., 2012, vol. 100, p. 233122.
Padova, P.D., Kubo, O., Olivieri, B., Quaresima, C., Nakayama, T., Aono, M., and Lay, G.L., NanoLett., 2012, vol. 12, p. 5500.
Zhao, Yu-L., Song, Y.-L., Song, W.-G., Liang, W., Jiang, X.-Yu., Tang, Z.-Y., Xu, X.-X., Wei, Z.-X., Liu, Y.-Q., Liu, M.-H., Jiang, L., Bao, X.-H., Wan, L.-J., and Bai, C.-L., Frontiers Phys., 2014, vol. 9, p. 257.
Arafune, R., Lin, C.-L., Kawahara, K., Tsukahara, N., Minarnitani, E., Kim, Y., Takagi, N., and Kawai, M., Surf. Sci., 2013, vol. 608, p. 297.
Chen, L., Liu, C.C., Feng, B., He, X., Cheng, P., Ding, Z., Meng, S., Yao, Y., and Wu, K., Phys. Rev. Lett., 2012, vol. 109, p. 056804.
Kulova, T.L., Skundin, A.M., Pleskov, Yu.V., Kon’kov, O.I., Terukov, E.I., and Trapeznikova, I.N., Semiconductors, 2006, vol. 40, p. 468.
Dimov, N., Kugino, S., and Yoshio, M., Electrochim. Acta, 2003, vol. 48, p. 1579.
Angel, E.C., Reparaz, J.S., Gomis-Bresco, J., Wagner, M.R., Cuffe, J., Graczykowski, B., Shchepetov, A., Jiang, H., Prunnila, M., Ahopelto, J., Alzina, F., and Sotomayor Torres, C.M., Appl. Mater., 2014, vol. 2, p. 012113.
Müller, K., Krause, F.F., Béché, A., Schowalter, M., Galioit, V., Löffler, S., Verbeeck, J., Zweck, J., Schattschneider, P., and Rosenauer, A., Nat. Commun., 2014, vol. 5, p. 5653.
Ohara, S., Suzuki, J., Sekine, K., and Takamura, T., J. Power Sources, 2004, vol. 136, p. 303.
Le, K.-L., Jung, J.-Y., Lee, S.-W., Moon, H.-S., and Park, J-W., J. Power Sources, 2004, vol. 129, p. 270.
Takamura, T., Ohara, S., Uehara, M., Suzuki, J., and Sekine, K., J. Power Sources, 2004, vol. 129, p. 96.
Osbom, T.H. and Farajian, A.A., J. Phys. Chem. C, 2012, vol. 116, p. 22916.
Tersoff, J., Phys. Rev. B, 1988, vol. 38, p. 9902.
Yu, R., Zhai, P., Li, G., and Liu, L., J. Electron. Mater., 2012, vol. 41, p. 1465.
Das, S.K., Roy, D., and Sengupta, S., J. Phys. F: Metal. Phys., 1977, vol. 7, p. 5.
Kawahara, K., Shirasawa, T., Arafune, R., Lin, C.-L., Takahashi, T., Kawai, M., and Takagi, N., Surf. Sci., 2014, vol. 623, p. 25.
Galashev, A.E. and Zaikov, Yu.P., Russ. J. Phys. Chem. A, 2015, vol. 89, p. 2243.
Galashev, A.E. and Zaikov, Yu.P., Russ. J. Electrochem., 2015, vol. 51, p. 867.
Peng, B., Cheng, F., Tao, Z., and Chen, J., J. Chem. Phys., 2010, vol. 133, p. 034701.
Plimpton, S., J. Comp. Phys., 1995, vol. 117, p. 1.
Galashev, A.E. and Polukhin, V.A., Phys. Met. Metallogr., 2014, vol. 115, p. 697.
Galashev, A.E. and Rakhmanova, O.R., Phys.-Usp., 2014, vol. 57, p. 970.
Tritsaris, G.A., Kaxiras, E., Meng, S., and Wang, E., Nano Lett., 2013, vol. 13, p. 2258.
Zhao, K., Okeke, O.U., and Kaxiras, E., J. Phys. Chem. C, 2012, vol. 116, p. 22212.
Zheng, F.-B. and Zhang, C.-W., Nanoscale Res. Lett., 2012, vol. 7, p. 422.
Author information
Authors and Affiliations
Corresponding author
Additional information
Original Russian Text © A.E. Galashev, Yu.P. Zaikov, R.G. Vladykin, 2016, published in Elektrokhimiya, 2016, Vol. 52, No. 10, pp. 1085–1094.
Rights and permissions
About this article
Cite this article
Galashev, A.E., Zaikov, Y.P. & Vladykin, R.G. Effect of electric field on lithium ion in silicene channel. Computer experiment. Russ J Electrochem 52, 966–974 (2016). https://doi.org/10.1134/S1023193516100049
Received:
Published:
Issue Date:
DOI: https://doi.org/10.1134/S1023193516100049