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Structural and thermal stability of BIMEVOX oxygen semiconductors

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Abstract

The results on the structural and thermal stability of different modifications of solid solutions Bi4V2 − x Fe x O11 − δ (BIFEVOX), where x = 0.05–0.6, and Bi4V2 − x Cu x/2Ti x/2O11 − δ (BICUTIVOX), where x = 0.025–0.50, are shown. The stability is assessed by varying the thermodynamic parameters of the medium and also the time parameters with the use of modern methods, namely, the high-temperature X-ray diffraction analysis, the differential scanning calorimetry, and the dilatometry. The γ-modification of BIFEVOX is shown to be stable in a wide range of temperatures and oxygen partial pressures.

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References

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Authors and Affiliations

  1. Ural State University, prosp. Lenina 51, Ekaterinburg, 620083, Russia

    M. V. Morozova, E. S. Buyanova, V. V. Khisametdinova, Yu. V. Emel’yanova, A. N. Shatokhina & V. M. Zhukovskii

  2. Institute of Metallurgy, Ural Branch, Russian Academy of Sciences, ul. Amundsena 101, Ekaterinburg, 620016, Russia

    S. A. Petrova

Authors
  1. M. V. Morozova
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  2. E. S. Buyanova
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  3. S. A. Petrova
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  4. V. V. Khisametdinova
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  5. Yu. V. Emel’yanova
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  6. A. N. Shatokhina
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  7. V. M. Zhukovskii
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Corresponding author

Correspondence to E. S. Buyanova.

Additional information

Original Russian Text © M.V. Morozova, E.S. Buyanova, S.A. Petrova, V.V. Khisametdinova, Yu.V. Emel’yanova, A.N. Shatokhina, V.M. Zhukovskii, 2011, published in Elektrokhimiya, 2011, Vol. 47, No. 4, pp. 475–479.

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Morozova, M.V., Buyanova, E.S., Petrova, S.A. et al. Structural and thermal stability of BIMEVOX oxygen semiconductors. Russ J Electrochem 47, 448–452 (2011). https://doi.org/10.1134/S1023193511040100

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  • DOI: https://doi.org/10.1134/S1023193511040100

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