Abstract
Nitrogenated nanocrystalline diamond thin films are grown from arc-plasma in CH4/Ar/H2/N2-gas mixtures and characterized by AFM-and Raman spectroscopy, X-ray diffraction and resistivity measurements. It is shown by Mott-Schottky plots taken in indifferent electrolyte (0.5 M H2SO4) that the behavior of the nitrogenated nanocrystalline diamond thin-film electrodes resembles that of n-type semiconductor; the donor effective concentration therein is estimated.
References
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Original Russian Text © Yu.V. Pleskov, S.M. Pimenov, Po-Yee Lim, V.G. Ralchenko, 2008, published in Elektrokhimiya, 2008, Vol. 44, No. 7, pp. 928–932.
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Pleskov, Y.V., Pimenov, S.M., Lim, PY. et al. Nanocrystalline nitrogenated diamond: An N-type electrode material. Russ J Electrochem 44, 861–865 (2008). https://doi.org/10.1134/S102319350807015X
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DOI: https://doi.org/10.1134/S102319350807015X