Skip to main content
Log in

Comparative Analysis of Algorithms for Solving Inverse Problems Related to Monochromatic Monitoring the Deposition of Multilayer Optical Coatings

  • MATHEMATICAL PHYSICS
  • Published:
Computational Mathematics and Mathematical Physics Aims and scope Submit manuscript

Abstract

The paper presents a comparative analysis of three fundamentally different algorithms for solving inverse problems of monitoring the layer thicknesses of optical coatings based on the data of monochromatic measurements of the reflection/transmission coefficients during deposition process. The previously developed geometric approach to the study of the thickness error correlation of deposited coatings is extended to the case of monochromatic measurements. A new parameter called the self-compensation factor was introduced to estimate the effect of error self-compensation. Its role in assessing the prospects for using various algorithms for coating deposition monitoring is shown.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Fig. 1.
Fig. 2.
Fig. 3.

Similar content being viewed by others

REFERENCES

  1. Optical Thin Films and Coatings, Ed. by A. Piegari and F. Flory, 2nd ed. (Woodhead, UK, Cambridge, 2018).

  2. A. Tikhonravov, M. Trubetskov, and T. Amotchkina, “Production strategies for high precision optical coatings,” Optical Thin Films and Coatings, Ed. by A. Piegari and F. Flory, 2nd ed. (Woodhead, UK, Cambridge, 2018).

  3. H. A. Macleod, Thin-Film Optical Filters, 4th ed. (Taylor and Francis, 2010).

    Book  Google Scholar 

  4. A. V. Tikhonravov, M. K. Trubetskov, and T. V. Amotchkina, “Investigation of the effect of accumulation of thickness errors in optical coatings production using broadband optical monitoring,” Appl. Opt. 45, 7026–7034 (2006).

    Article  Google Scholar 

  5. H. A. Macleod, “Turning value monitoring of narrow-band all-dielectric thin-film optical filters,” Opt. Acta 19, 1–28 (1972).

    Article  Google Scholar 

  6. P. Bousque, A. Fornier, R. Kowalczyk, E. Pelletier, and P. Roche, “Optical filters: Monitoring process allowing the auto-correction of thickness errors,” Thin Solid Films 13, 285–290 (1972).

    Article  Google Scholar 

  7. A. Tikhonravov, I. Kochikov, and A. Yagola, “Mathematical investigation of the error self-compensation mechanism in optical coating technology,” Inverse Probl. Sci. Eng. 26, 1214 (2018).

    Article  MathSciNet  Google Scholar 

  8. A. V. Tikhonravov, I. V. Kochikov, I. A. Matvienko, S. A. Sharapova, and A. G. Yagola, “Estimates related to the error self-compensation mechanism in optical coatings deposition,” Moscow Univ. Phys. Bull. 73 (6), 627–631 (2018).

    Article  Google Scholar 

  9. A. V. Tikhonravov, I. V. Kochikov, I. A. Matvienko, T. F. Isaev, D. V. Lukyanenko, S. A. Sharapova and A. G. Yagola, “Correlation of errors in optical coating production with broad band monitoring,” Numer. Methods Program. 19, 439–447 (2018).

    Google Scholar 

  10. A. Tikhonravov, I. Kochikov, I. Matvienko, T. Isaev, and A. Yagola, “Strategies of broadband monitoring aimed at minimizing deposition errors,” Coatings 9 (12), 1–10 (2019).

    Article  Google Scholar 

  11. I. V. Kochikov, S. A. Sharapova, A. G. Yagola, and A. V. Tikhonravov, “Correlation of errors in inverse problems of optical coatings monitoring,” J. Inverse Ill-Posed Probl. 28 (6), 915–921 (2020).

    Article  MathSciNet  Google Scholar 

  12. I. V. Kochikov, Yu. S. Lagutin, A. A. Lagutina, D. V. Lukyanenko, A. V. Tikhonravov, and A. G. Yagola, “Stable method for optical monitoring the deposition of multilayer optical coatings,” Comput. Math. Math. Phys. 60 (12), 2056–2063 (2020).

    Article  MathSciNet  Google Scholar 

  13. A. Macleod, “Monitoring of optical coatings,” Appl. Opt. 20, 82–89 (1981).

    Article  Google Scholar 

  14. I. V. Kochikov, Yu. S. Lagutin, A. A. Lagutina, D. V. Lukyanenko, A. V. Tikhonravov, and A. G. Yagola, “A nonlocal algorithm for analyzing the data of monochromatic optical control in the process of multilayer coating deposition,” Numer. Methods Program. 20, 471–480 (2019).

    Google Scholar 

  15. I. V. Kochikov, Yu. S. Lagutin, A. A. Lagutina, D. V. Lukyanenko, A. V. Tikhonravov, and A. G. Yagola, “Raising the accuracy of monitoring the optical coating deposition by application of a nonlocal algorithm of data analysis,” J. Appl. Ind. Math. 14 (2), 330–339 (2020).

    Article  Google Scholar 

  16. V. Zhupanov, I. Kozlov, V. Fedoseev, P. Konotopov, M. Trubetskov, and A. Tikhonravov, “Production of Brewster angle thin film polarizers using a ZrO2/SiO2 pair of materials,” Appl. Opt. 56, 30–34 (2017).

    Article  Google Scholar 

Download references

Funding

This work was supported by Russian Science Foundation, project no. 16-11-10219.

Author information

Authors and Affiliations

Authors

Corresponding authors

Correspondence to I. V. Kochikov, Yu. S. Lagutin, A. A. Lagutina, D. V. Lukyanenko, A. V. Tikhonravov, S. A. Sharapova or A. G. Yagola.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Kochikov, I.V., Lagutin, Y.S., Lagutina, A.A. et al. Comparative Analysis of Algorithms for Solving Inverse Problems Related to Monochromatic Monitoring the Deposition of Multilayer Optical Coatings. Comput. Math. and Math. Phys. 61, 1504–1510 (2021). https://doi.org/10.1134/S0965542521090116

Download citation

  • Received:

  • Revised:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1134/S0965542521090116

Keywords:

Navigation