Abstract
The paper presents a comparative analysis of three fundamentally different algorithms for solving inverse problems of monitoring the layer thicknesses of optical coatings based on the data of monochromatic measurements of the reflection/transmission coefficients during deposition process. The previously developed geometric approach to the study of the thickness error correlation of deposited coatings is extended to the case of monochromatic measurements. A new parameter called the self-compensation factor was introduced to estimate the effect of error self-compensation. Its role in assessing the prospects for using various algorithms for coating deposition monitoring is shown.
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Funding
This work was supported by Russian Science Foundation, project no. 16-11-10219.
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Kochikov, I.V., Lagutin, Y.S., Lagutina, A.A. et al. Comparative Analysis of Algorithms for Solving Inverse Problems Related to Monochromatic Monitoring the Deposition of Multilayer Optical Coatings. Comput. Math. and Math. Phys. 61, 1504–1510 (2021). https://doi.org/10.1134/S0965542521090116
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DOI: https://doi.org/10.1134/S0965542521090116