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Adhesive and electrical properties of the interface between Pb1 − x Mn x Te Crystals and In-Ag-Au alloy

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Abstract

The effect of annealing of Pb1 − x Mn x Te crystals at ∼690 K and structures on their basis at ∼383 K on the adhesive and electric properties of the interface in the Pb1 − x Mn x Te-(In-Ag-Au) structure was studied over the temperature range ∼77–300 K. The contacts possessed high adhesive strength. The effect of annealing on contact resistance r c was determined by a change in the specific resistance of crystals, diffusion of Ag atoms into the near-contact area of crystals, and the formation of intermediate phases of the Ag2Te type at the interface.

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Authors and Affiliations

  1. Institute of Physics, National Academy of Sciences, Azerbaijan, Baku

    T. D. Alieva, G. J. Abdinova, N. M. Akhundova & D. Sh. Abdinov

Authors
  1. T. D. Alieva
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  2. G. J. Abdinova
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  3. N. M. Akhundova
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  4. D. Sh. Abdinov
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Corresponding author

Correspondence to T. D. Alieva.

Additional information

Original Russian Text © T.D. Alieva, G.J. Abdinova, N.M. Akhundova, D.Sh. Abdinov, 2008, published in Zhurnal Fizicheskoi Khimii, 2008, Vol. 82, No. 11, pp. 2185–2186.

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Alieva, T.D., Abdinova, G.J., Akhundova, N.M. et al. Adhesive and electrical properties of the interface between Pb1 − x Mn x Te Crystals and In-Ag-Au alloy. Russ. J. Phys. Chem. 82, 1967–1968 (2008). https://doi.org/10.1134/S0036024408110319

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  • DOI: https://doi.org/10.1134/S0036024408110319

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