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Raman scattering for lead telluride-based thin film structures

Abstract

For single-crystal epitaxial lead telluride films, Raman spectra obtained under conditions in which the intensity of incident radiation is minimized in order to suppress photo-initiated oxidative process are presented. The spectra were measured with an InVia Renishaw spectrometer at an exciting radiation wavelength of 514.5 nm and in-line focusing of a 20-μW beam. These measuring conditions allowed us for the first time to experimentally observe a large set of peaks for lead telluride, the positions of which were in line with the theoretical values of harmonics and combinatorial PbTe phonon modes. In order to demonstrate the possibilities of the methodology used, the picture of phonon modes for single-crystal and polycrystalline films of the Pb1 − x Eu x Te (0.05 ⩽ x ⩽ 0.10) solution was additionally considered.

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Correspondence to S. P. Zimin.

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Original Russian Text © S.P. Zimin, E.S. Gorlachev, A.V. Baranov, S.A. Cherevkov, E. Abramof, P.H.O. Rappl, 2014, published in Optika i Spektroskopiya, 2014, Vol. 117, No. 5, pp. 770–774.

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Zimin, S.P., Gorlachev, E.S., Baranov, A.V. et al. Raman scattering for lead telluride-based thin film structures. Opt. Spectrosc. 117, 748–752 (2014). https://doi.org/10.1134/S0030400X14110241

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Keywords

  • Raman Scattering
  • PbTe
  • Phonon Mode
  • Raman Scattering Spectrum
  • Lead Telluride