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Sas_analyzer software for small-angle X-ray scattering data treatment

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Abstract

New approaches to the analysis of small-angle X-ray scattering data from nanoscale systems based on the optimization and direct multiple shooting methods are presented. A program is developed, which bears on these new approaches and allows a user to model small-angle X-ray diffraction data, introduce collimation corrections, and analyze dispersions in the samples. The program results for a number of typical nanosized systems (sols, catalysts) are reported and the comparison with currently available programs for small-angle data processing is presented.

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Authors and Affiliations

  1. Boreskov Institute of Catalysis, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia

    S. A. Poluyanov, F. V. Tuzikov, Yu. V. Larichev & S. V. Tsybulya

  2. Novosibirsk National Research State University, Novosibirsk, Russia

    Yu. V. Larichev & S. V. Tsybulya

Authors
  1. S. A. Poluyanov
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  2. F. V. Tuzikov
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  3. Yu. V. Larichev
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  4. S. V. Tsybulya
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Corresponding author

Correspondence to Yu. V. Larichev.

Additional information

Translated from Zhurnal Strukturnoi Khimii, Vol. 57, No. 4, pp. 809-814, May-June, 2016.

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Poluyanov, S.A., Tuzikov, F.V., Larichev, Y.V. et al. Sas_analyzer software for small-angle X-ray scattering data treatment. J Struct Chem 57, 771–776 (2016). https://doi.org/10.1134/S0022476616040211

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  • DOI: https://doi.org/10.1134/S0022476616040211

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