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X-ray diffraction and positron annihilation life-time spectroscopy studies of polymetalloorganosiloxanes

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Abstract

X-ray diffractometry and positron annihilation life-time spectroscopy are applied to study the structural features of polymetallophenylsiloxane (PMOS) samples with the Si/M ratio corresponding to the metal valence state, namely, interplanar spacings (d 001), coherentscattering region (CSR) sizes, cross-section areas of polymer chains (s) calculated by the Miller-Boyer method, and the degree of amorphousness (β). It is demonstrated that the direct proportional dependence between the logarithm of the interplanar spacing d 001 and the logarithm of the cross-section area s is observed for PMOSs. This is an inverse dependence relative to changes in the crystal chemical ion radius. The extraction of the iron ion from polyferrophenylsiloxane leads to a sharp decrease in the interplanar spacing, which turns out to be less than d 001 in polyphenylsiloxanes, and also CSR increases due to a decrease in the diameter of the polymer chain. The positron annihilation life-time spectroscopy data show the observed direct dependence of the annihilation intensity (I 3), the annihilation rate (K 3), the degree of amorphousness on the PMOS cross-section area.

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Authors and Affiliations

  1. Far Eastern Federal University, Vladivostok, Russia

    S. V. Gardionov, N. P. Shapkin, M. I. Balanov, V. V. Vasilieva, V. I. Razov & V. O. Trukhin

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  1. S. V. Gardionov
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  2. N. P. Shapkin
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  3. M. I. Balanov
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  4. V. V. Vasilieva
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  5. V. I. Razov
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  6. V. O. Trukhin
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Correspondence to S. V. Gardionov.

Additional information

Translated from Zhurnal Strukturnoi Khimii, Vol. 57, No. 3, pp. 537-541, March-April, 2016.

Original Russian Text © 2016 S. V. Gardionov, N. P. Shapkin, M. I. Balanov, V. V. Vasilieva, V. I. Razov, V. O. Trukhin.

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Gardionov, S.V., Shapkin, N.P., Balanov, M.I. et al. X-ray diffraction and positron annihilation life-time spectroscopy studies of polymetalloorganosiloxanes. J Struct Chem 57, 507–511 (2016). https://doi.org/10.1134/S0022476616030124

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  • DOI: https://doi.org/10.1134/S0022476616030124

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