Abstract
A number of experimental techniques of the X-ray diffraction investigation of crystal aggregates is presented with employment of modern diffractometers equipped with 2D CCD detectors. Fundamentally, these techniques are based on taking a series of Debye-Scherrer photographs. The measurement accuracy of the interplanar distances and unit cell parameters using internal and external standards is discussed.
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Original Russian Text © 2014 A. V. Panchenko, N. D. Tolstykh, S. A. Gromilov.
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Translated from Zhurnal Strukturnoi Khimii, Vol. 55, Supplement 1, pp. S24–S29, 2014.
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Panchenko, A.V., Tolstykh, N.D. & Gromilov, S.A. The technique of X-ray diffraction investigation of crystal aggregates. J Struct Chem 55, 1209–1214 (2014). https://doi.org/10.1134/S002247661407004X
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DOI: https://doi.org/10.1134/S002247661407004X