Abstract
In the work, X-ray and Auger microprobe studies of the surface of crystals prepared from powder samples of CuCr1−x V x S2 disulfides (x = 0÷0.11) by crystallization from melt in the sulfur vapor atmosphere. Sample slabs cut from ingots include crystalline layered blocks with different orientation of copper-containing extended linear inclusions separated by disulfide matrix layers. The results of the microprobe analysis of regions with copper-containing inclusions and the regions adjacent to them are presented.
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Original Russian Text © 2014 V. V. Sokolov, E. V. Korotaev, N. N. Peregudova, B. M. Kuchumov, P. A. Prozorov, M. V. Topyakova, L. N. Mazalov, Yu. P. Dikov, M. I. Buleev, A. Yu. Pichugin, I. Yu. Filatova, A. S. Berdinskii, A. A. Velichko.
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Translated from Zhurnal Strukturnoi Khimii, Vol. 55, No. 5, pp. 898–904, September–October, 2014.
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Sokolov, V.V., Korotaev, E.V., Peregudova, N.N. et al. X-ray and Auger microprobe studies of vanadium-doped layered chromium-copper disulfide crystals. J Struct Chem 55, 852–857 (2014). https://doi.org/10.1134/S0022476614050084
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DOI: https://doi.org/10.1134/S0022476614050084